GSO IEC 62132-1:2015

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions

GSO IEC 62132-1:2015 发布历史

GSO IEC 62132-1:2015由GSO 发布于 2015-09-03。

GSO IEC 62132-1:2015在国际标准分类中归属于: 31.200 集成电路、微电子学。

GSO IEC 62132-1:2015 的最新版本是哪一版？

最新版本是 GSO IEC 62132-1:2015 。

GSO IEC 62132-1:2015的历代版本如下：

• 2015年 GSO IEC 62132-1:2015

This part of IEC 62132 provides general information and definitions on measurement of conducted and radiated electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also provides a description of measurement conditions, test equipment and set-up, as well as the test procedures and content of the test reports. A test method comparison table is included in Annex A to assist in selecting the appropriate measurement method(s). This standard describes general conditions required to obtain a quantitative measure of immunity of ICs in a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this standard are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the injected voltages and currents, together with the responses of the ICs tested at controlled conditions, yields information about the potential immunity of the IC to conducted and radiated RF disturbances in a given application.

标准号

GSO IEC 62132-1:2015

发布

2015年

发布单位

GSO

当前最新

GSO IEC 62132-1:2015

 

 

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