GSO IEC 60749-24:2014

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

GSO IEC 60749-24:2014 发布历史

GSO IEC 60749-24:2014由GSO 发布于 2014-12-25。

GSO IEC 60749-24:2014在国际标准分类中归属于: 31.080 半导体分立器件。

GSO IEC 60749-24:2014 的最新版本是哪一版？

最新版本是 GSO IEC 60749-24:2014 。

GSO IEC 60749-24:2014的历代版本如下：

• 2014年 GSO IEC 60749-24:2014

The unbiased highly accelerated stress testing (HAST) is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It is a highly accelerated test which employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it. Bias is not applied in this test to ensure that the failure mechanisms potentially overshadowed by bias can be uncovered (e.g. galvanic corrosion). This test is used to identify failure mechanisms internal to the package and is destructive. NOTE This test is a complete rewrite of the test contained in Clause 4C of Chapter 3 of IEC 60749 (1996) (without bias voltage).

标准号

GSO IEC 60749-24:2014

发布

2014年

发布单位

GSO

当前最新

GSO IEC 60749-24:2014

 

 

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