GSO IEC 60747-10:2014

Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

GSO IEC 60747-10:2014 发布历史

GSO IEC 60747-10:2014由GSO 发布于 2014-12-25。

GSO IEC 60747-10:2014在国际标准分类中归属于: 31.200 集成电路、微电子学。

GSO IEC 60747-10:2014 的最新版本是哪一版？

最新版本是 GSO IEC 60747-10:2014 。

GSO IEC 60747-10:2014的历代版本如下：

• 2014年 GSO IEC 60747-10:2014

.(This publication forms part of the IEC Quality Assessment System for Electronic Components (IECQ This publication is a generic specification for semiconductor devices: discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for: measurement methods of electrical characteristics; climatic and mechanical tests; endurance tests. NOTE - This publication must be supplemented by the approved sectional, family and blank detail specifications, .where they exist, appropriate to the specific individual type or types

标准号

GSO IEC 60747-10:2014

发布

2014年

发布单位

GSO

当前最新

GSO IEC 60747-10:2014

 

 

GSO IEC 60747-10:2014相似标准