GSO IEC TS 62607-6-4:2021

Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Surface conductance measurement using resonant cavity


GSO IEC TS 62607-6-4:2021 发布历史

GSO IEC TS 62607-6-4:2021由GSO 发布于 2021-07-01。

GSO IEC TS 62607-6-4:2021 的最新版本是哪一版?

最新版本是 GSO IEC TS 62607-6-4:2021

GSO IEC TS 62607-6-4:2021的历代版本如下:

 

IEC TS 62607-6-4:2016(E) establishes a method for determining the surface conductance of two-dimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite. The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz. Surface conductance measurement by resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area. This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area.

标准号
GSO IEC TS 62607-6-4:2021
发布
2021年
发布单位
GSO
当前最新
GSO IEC TS 62607-6-4:2021
 
 

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