GSO IEC 62433-2:2013由GSO 发布于 2013-12-31。
GSO IEC 62433-2:2013在国际标准分类中归属于: 31.200 集成电路、微电子学。
GSO IEC 62433-2:2013 EMC IC 建模 第2部分:EMI 抗扰度的集成电路模型 传导发射建模 (ICEM- CE)的最新版本是哪一版?
最新版本是 GSO IEC 62433-2:2013 。
EC 62433-2:2008 specifies macro-models for ICs to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE model can also be used for modelling an IC-die, a functional block and an Intellectual Property block (IP). The ICEM-CE model can be used to model both digital and analogue ICs. Basically, conducted emissions have two origins: - conducted emissions through power supply terminals and ground reference structures; - conducted emissions through input/output (I/O) terminals. The ICEM-CE model addresses those two types of origins in a single approach. This standard defines structures and components of the macro-model for EMI simulation taking into account the IC's internal activities. This standard gives general data, which can be implemented in different formats or languages such as IBIS, IMIC, SPICE, VHDL-AMS and Verilog. SPICE is however chosen as default simulation environment to cover all the conducted emissions. This standard also specifies requirements for information that shall be incorporated in each ICEM-CE model or component part of the model for model circulation, but description syntax is not within the scope of this standard.
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