General: This test plan defines the requirements of data bus components which comply with the requirements of MIL-STD-1553B@ Digital Time Division Command/Response Multiplex Data Bus. Application: The requirements of the test plan shall apply to data bus components designed to meet MIL-STD-1553B@ when invoked in a specification or a statement of work. The test plan may be used for both design verification and production testing of data bus components. This test plan addresses only the electrical characteristics of the data bus components. Differences between data bus systems will exist due to particular program requirements and designer options. The system designer and contractor must therefore allow for the effects of temperature@ vibration@ sealing@ EMI/EMP@ and other environmental factors on data bus component characteristics. Consideration of these factors will improve the possibility that data bus components will operate properly when used in the intended environment. The pass/fail requirements of the test plan shall be met under all system operating environments. The DC resistance criteria@ however@ are assumed to be measured at 25??and would have to be corrected for measurements made at another temperature. For the purposes of this test plan@ it must be possible to identify all bus and stub connections@ the selected bus cable characteristic impedance@ the transformer winding resistances@ and the values of any series and terminating resistors used within the coupler. This information must be included in a supporting documentation package provided by the bus coupler or bus terminator manufacturer. Because transformer coupled data bus couplers may contain terminating resistors and/or have cables attached@ it will not be possible to directly test the transformer and resistors in every case. In such cases the transformers and resistors shall be tested prior to assembly to verify they meet the requirements of MIL-STD-1553B. Again@ system designers must make allowances for the expected environment when testing those coupler components. Both connectorized and nonconnectorized couplers and terminators can be tested using this plan@ provided electrical contact can be made to all signal (high and low) and shield (ground) connections of the components. Multiple stub couplers are tested by repeating the tests contained herein for each individual stub. An adjustment to the test limits may be required. The adjustments are specified in the appropriate sections. The tests may be performed in any order unless otherwise specified.