This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents. Measurement Philosophy The near field magnetic or electromagnetic radiation from an integrated circuit can be measured in a controlled manner that yields repeatable results. These emissions are related to the far field electromagnetic radiation potential of the IC and of the electronic module of which it is a part. The intent is to provide a quantitative measure of the RF emissions from ICs for comparison or other purposes. Similar quantitative measures of the immunity of an IC to RF fields and transients are being investigated.