IEC 60904-10-1998
光伏器件 第10部分:线性测量方法

Photovoltaic devices - Part 10: Methods of linearity measurement


哪些标准引用了IEC 60904-10-1998

 

GB/T 6495.7-2006光伏器件 第7部分:光伏器件测量过程中引起的光谱失配误差的计算DIN EN 60904-2-2008光伏器件.第2部分:基准太阳能装置的要求(IEC 60904-2-2007)DIN EN 61646-2009薄膜地面光电(PV)模块.设计鉴定和定型BS EN 61646-2008薄膜地面光电(PV)模数.设计合格鉴定和型号批准JIS C8990-2009晶体硅地面光电(PV)模块.设计鉴定和型号核准BS EN 60904-7-2009光电器件.第7部分:光电器件测量的光谱失谐修正的估算DIN EN 60904-7-2009光电设备.第7部分:光电器件测量的光谱失谐修正的估算(IEC 60904-7:2008),德文版本EN 60904-7:2009IEC 61646-2008薄膜地面光电(PV)模块.设计鉴定和定型IEC 60904-7-2008光电器件.第7部分:光电器件的测量用光谱错配修正的计算DIN EN 60904-1-2007光电器件.第1部分:光电器件电流-电压特征测量(IEC 60904-1:2006)BS EN 60904-2-2007光电器件.基准太阳能装置的要求BS EN 60904-9-2007光伏器件.第9部分:太阳模拟器性能要求JIS C8990-2009晶体硅地面光电(PV)模块.设计鉴定和型号核准BS EN 61853-2-2016光伏(PV)模块性能试验和能源评级. 光谱响应率, 入射角和模块操作温度测量BS EN 60904-2-2015光电器件.对光伏基准装置的要求BS EN 50380-2017光电模块的标记和文件要求BS EN 61215-1-2016地面光伏(PV)模组. 设计质量和型式批准. 试验要求BS EN 60904-2-2015光电器件.对光伏基准装置的要求BS EN 60904-5-2011光伏器件.用开路电压法测定光伏(PV)器件的等效电池温度(ECT)BS EN 61829-2016光伏 (PV) 阵列. 电流电压特性现场测量

 

 

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标准号
IEC 60904-10-1998
发布日期
1998年02月
实施日期
废止日期
中国标准分类号
F12
国际标准分类号
27.160
发布单位
IX-IEC
代替标准
IEC 60904-10-2009
适用范围
This part of IEC 60904 describes procedures used to determine the degree of linearity of any photovoltaic device parameter with respect to a test parameter. It is primarily intended for use by calibration laboratories, module manufacturers and system designers. Photovoltaic (PV) module and system performance evaluations, and performance translations from one set of temperature and irradiance conditions to another frequently rely on the use of linear equations (see IEC 60891 and IEC 61829). This standard lays down the linearity requirements and test methods to ensure that these linear equations will give satisfactory results. Indirectly, these requirements dictate the range of the temperature and irradiance variables over which the equations can be used. The methods of measurement described in this standard apply to all PV devices and are intended to be carried out on a sample or on a comparable device of identical technology. They should be performed prior to all measurement and correction procedures that require a linear device. The methodology used in this standard is similar to that specified in IEC 60891 in which a linear (straight-line) function is fitted to a set of data points using a least-squares fit calculation routine. The variation of the data from this function is also calculated, and the definition of linearity is expressed as an allowable variation percentage. A device is considered linear when the following conditions are met over the temperature and irradiance range of interest. Typically, this range of temperature is 25 ℃ to 60 ℃ minimum, and the irradiance range of 700 W·m to 1 000 W·m minimum. a) For the curve of short-circuit current versus irradiance, the normalized standard deviation of the slope (σs/m) should be less than 0,02. b) For the curve of open-circuit voltage versus the logarithm of irradiance, the normalized standard deviation of the slope (σs/m) should be less than 0,05. c) For the curve of open-circuit voltage and short-circuit current versus temperature, the normalized standard deviation of the slope (σs/m) should be less than 0,1. d) The variation of relative spectral response at a specified voltage is less than 5 % for the wavelength band. NOTE 1 - Many of the IEC PV standards require spectral mismatch corrections which in turn require spectral response measurements. Therefore, the linearity of spectral response with respect to temperature and irradiance is important. It can also be significant for new technologies such as photochemical cells. NOTE 2 - Because the relative spectral response of some devices such as amorphous silicon varies considerably with voltage, it is important that the linearity determination be performed at a fixed voltage. The voltage selected is governed by the ultimate usage. Vmax may be selected if the maximum power regime is the area of interest, and for calibration zero bias voltage might be more appropriate. NOTE 3 - It should be noted that the relative spectral response of some devices varies with temperature and irradiance. Some of these effects may be accounted for as changes in the items a) and c) short-circuit current non-linearity, but some may not be. The item d) requirement accounts for these non-linearities. General procedures for determining the degree of linearity for these and any other performance parameter are described in clauses 4 through 6.

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