IEC 62132-1-2006
集成电路.150kHz～1GHz电磁抗扰度的测量.第1部分:一般条件和定义

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions

IEC 62132-1-2006 发布历史

This part of IEC 62132 provides general information and definitions on measurement of conducted and radiated electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also provides a description of measurement conditions, test equipment and set-up, as well as the test procedures and content of the test reports. A test method comparison table is included in Annex A to assist in selecting the appropriate measurement method(s). This standard describes general conditions required to obtain a quantitative measure of immunity of ICs in a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this standard are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the injected voltages and currents, together with the responses of the ICs tested at controlled conditions, yields information about the potential immunity of the IC to conducted and radiated RF disturbances in a given application.

IEC 62132-1-2006由国际电工委员会 IX-IEC 发布于 2006-01。

IEC 62132-1-2006 在中国标准分类中归属于: L56 半导体集成电路，在国际标准分类中归属于: 31.200 集成电路、微电子学。

IEC 62132-1-2006的历代版本如下：

• 2006年01月 IEC 62132-1-2006 集成电路.150kHz～1GHz电磁抗扰度的测量.第1部分:一般条件和定义
• 2015年10月29日 IEC 62132-1-2015 集成电路 - 电磁抗扰度测量 - 第1部分:一般条件和定义

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标准号

IEC 62132-1-2006

发布日期

2006年01月

实施日期

废止日期

无

中国标准分类号

L56

国际标准分类号

31.200

发布单位

IX-IEC

代替标准

IEC 62132-1-2015

被代替标准

IEC 47A/734/FDIS-2005

适用范围

This part of IEC 62132 provides general information and definitions on measurement of conducted and radiated electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also provides a description of measurement conditions, test equipment and set-up, as well as the test procedures and content of the test reports. A test method comparison table is included in Annex A to assist in selecting the appropriate measurement method(s). This standard describes general conditions required to obtain a quantitative measure of immunity of ICs in a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this standard are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the injected voltages and currents, together with the responses of the ICs tested at controlled conditions, yields information about the potential immunity of the IC to conducted and radiated RF disturbances in a given application.

IEC 62132-1-2006系列标准

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