SAE J1113/12-2006
经由补给线以外电线的传导和耦合电容性及感应耦合引起的电干扰

Electrical Interference by Conduction and Coupling Capacitive and Inductive Coupling via Lines Other than Supply Lines

被代替

SAE J1113/12-2006 发布历史

This SAE Standard establishes a common basis for the evaluation of devices and equipment in vehicles against transient transmission by coupling via lines other than the power supply lines. The test demonstrates the immunity of the instrument, device, or equipment to coupled fast transient disturbances, such as those caused by switching of inductiveloads, relay contact bouncing, etc. Four test methods are presented – Capacitive Coupling Clamp, Chattering Relay, Direct Capacitor Coupling, and Inductive Coupling Clamp.1.1 Measurement PhilosophyYears of experience with immunity testing of instruments, devices, and equipment shows the need for tests simulating transient coupling phenomena covering a wide range of electric and electromagnetic disturbances on non-supply leads.The knowledge of these facts is common among EMC experts, and many companies have developed such coupling tests.1.1.1 Capacitive Coupling Clamp (CCC)The fast transient test uses bursts composed of a number of fast pulses, which are coupled into all lines other than the supply lines of electronic equipment. The short rise time, the repetition rate, and the low energy of the transients aresignificant for the test.Theoretical and practical examinations of capacitive and inductive coupling test procedures for car electrical systems with respect to coupling via lines other than the supply lines have been made. Since in the actual test situation neither theoriginal cable harness nor the possible sources of interference are available, worst case testing must be performed which is represented by capacitive coupling. The coupling clamp can be used to couple these fast transients to the DUT via thetest harness.1.1.2 Chattering RelayIn an actual vehicle, inductive transients are usually random in occurrence, amplitude, and duration. Other methods of testing using commercial test instruments that create a very repeatable event are much less effective at finding certaintypes of concerns since they do not create such a random sequence. This randomness is extremely critical for DUTs containing microprocessors since the transients must often line up in time with a certain point in software execution tohave an effect. To create such a match using commercial transient generators takes an unreasonable amount of test time. The noise created by this test is designed to provide a continuous series of random transients using a chatteringrelay.1.1.3 Direct Capacitor CouplingThe Direct Capacitor Coupling (DCC) method uses a capacitor to directly couple both fast and slow transients dependingon the capacitor used. When using the DCC method, care has to be taken to ensure that signals are not unacceptably distorted (e.g. communication on bus systems). For the fast transient test, the disadvantage of the DCC method is thateach line is tested individually unlike the Coupling Clamp method.1.1.4 Inductive Coupling ClampThe Inductive Coupling Clamp (ICC) method uses the Bulk Current Injection components to apply the test pulses. The method is able to better couple the slow transient test pulses. For DUTs with a moderate or large number of lines to be tested, this method has an advantage over the DCC method.

SAE J1113/12-2006由美国机动车工程师协会 US-SAE 发布于 2006-08-01。

SAE J1113/12-2006 在中国标准分类中归属于: L06 电磁兼容，在国际标准分类中归属于: 43.040.10 电气和电子设备。

SAE J1113/12-2006 发布之时，引用了标准

• ISO 7637-3 道路车辆.传导和耦合引起的电干扰.第3部分:通过电容耦合和电感耦合经由非电源线线路的瞬间电传输*， 2016-07-01 更新
• SAE J1113-1 *， 2018-10-01 更新
• SAE J1113-4 SAE J 1113-1975*， 2020-01-01 更新

* 在 SAE J1113/12-2006 发布之后有更新，请注意新发布标准的变化。

SAE J1113/12-2006的历代版本如下：

• 2022年 SAE J1113/12-2022
• 2017年 SAE J1113/12-2017
• 2006年 SAE J1113/12-2006 经由补给线以外电线的传导和耦合电容性及感应耦合引起的电干扰
• 2000年 SAE J1113/12-2000 施工和连接引起的电干扰.连接箍和震颤继电器
• 1994年 SAE J1113/12-1994

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标准号

SAE J1113/12-2006

发布

2006年

发布单位

美国机动车工程师协会

替代标准

SAE J1113/12-2017

当前最新

SAE J1113/12-2022

 

 

引用标准

ISO 7637-3 SAE J1113-1 SAE J1113-11 SAE J1113-4

适用范围

This SAE Standard establishes a common basis for the evaluation of devices and equipment in vehicles against transient transmission by coupling via lines other than the power supply lines. The test demonstrates the immunity of the instrument, device, or equipment to coupled fast transient disturbances, such as those caused by switching of inductiveloads, relay contact bouncing, etc. Four test methods are presented – Capacitive Coupling Clamp, Chattering Relay, Direct Capacitor Coupling, and Inductive Coupling Clamp.1.1 Measurement PhilosophyYears of experience with immunity testing of instruments, devices, and equipment shows the need for tests simulating transient coupling phenomena covering a wide range of electric and electromagnetic disturbances on non-supply leads.The knowledge of these facts is common among EMC experts, and many companies have developed such coupling tests.1.1.1 Capacitive Coupling Clamp (CCC)The fast transient test uses bursts composed of a number of fast pulses, which are coupled into all lines other than the supply lines of electronic equipment. The short rise time, the repetition rate, and the low energy of the transients aresignificant for the test.Theoretical and practical examinations of capacitive and inductive coupling test procedures for car electrical systems with respect to coupling via lines other than the supply lines have been made. Since in the actual test situation neither theoriginal cable harness nor the possible sources of interference are available, worst case testing must be performed which is represented by capacitive coupling. The coupling clamp can be used to couple these fast transients to the DUT via thetest harness.1.1.2 Chattering RelayIn an actual vehicle, inductive transients are usually random in occurrence, amplitude, and duration. Other methods of testing using commercial test instruments that create a very repeatable event are much less effective at finding certaintypes of concerns since they do not create such a random sequence. This randomness is extremely critical for DUTs containing microprocessors since the transients must often line up in time with a certain point in software execution tohave an effect. To create such a match using commercial transient generators takes an unreasonable amount of test time. The noise created by this test is designed to provide a continuous series of random transients using a chatteringrelay.1.1.3 Direct Capacitor CouplingThe Direct Capacitor Coupling (DCC) method uses a capacitor to directly couple both fast and slow transients dependingon the capacitor used. When using the DCC method, care has to be taken to ensure that signals are not unacceptably distorted (e.g. communication on bus systems). For the fast transient test, the disadvantage of the DCC method is thateach line is tested individually unlike the Coupling Clamp method.1.1.4 Inductive Coupling ClampThe Inductive Coupling Clamp (ICC) method uses the Bulk Current Injection components to apply the test pulses. The method is able to better couple the slow transient test pulses. For DUTs with a moderate or large number of lines to be tested, this method has an advantage over the DCC method.

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