IEC/PAS 62483-2006
测量锡和锡合金表面须晶生长的试验方法

Test method for measuring whisker growth on tin and tin alloy surface finishes

IEC/PAS 62483-2006 发布历史

The methodology presented in this document, see Annex A for process flow, is applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document. The purpose of this PAS is to: ? Provide an industry-standardized suite of tests for measurement and comparison of whisker propensity for different plating or finish chemistries and processes. ? Provide a consistent inspection protocol for tin whisker examination. ? Provide a standard reporting format.

IEC/PAS 62483-2006由国际电工委员会 IX-IEC 发布于 2006-09。

IEC/PAS 62483-2006 在中国标准分类中归属于: L40 半导体分立器件综合，在国际标准分类中归属于: 31.080.01 半导体器分立件综合。

IEC/PAS 62483-2006的历代版本如下：

• 2006年09月 IEC/PAS 62483-2006 测量锡和锡合金表面须晶生长的试验方法

IEC/PAS 62483-2006 测量锡和锡合金表面须晶生长的试验方法 于 2013-09 变更为 IEC 62483-2013 半导体器件上锡和锡合金精加工表面的锡晶须敏感性的环境验收要求。

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标准号

IEC/PAS 62483-2006

发布日期

2006年09月

实施日期

废止日期

无

中国标准分类号

L40

国际标准分类号

31.080.01

发布单位

IX-IEC

代替标准

IEC 62483-2013

适用范围

The methodology presented in this document, see Annex A for process flow, is applicable for studying tin whisker growth from finishes containing a predominance of tin (Sn). This test method may not be sufficient for applications with special requirements, e.g., military or aerospace. Additional requirements may be specified in the appropriate requirements document. The purpose of this PAS is to: ? Provide an industry-standardized suite of tests for measurement and comparison of whisker propensity for different plating or finish chemistries and processes. ? Provide a consistent inspection protocol for tin whisker examination. ? Provide a standard reporting format.