JEDEC JEP148-2004
基于故障风险的物理性和选择评估的半导体器件的鉴定

Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment

JEDEC JEP148-2004 发布历史

The penetration of semiconductor products into an increasing variety of application segments together with the economic forces of cost and time-to-market require efficient qualification concepts. This requirement influences the organization of the qualification process in conjunction with the development / innovation process as well as the qualification methodology. Proactive practices such as advance quality planning, "incremental qualification" and confirmation during development have to be practiced in order to meet time to market goals. Results of theses activities including the use of further available knowledge will be the basis for the qualification as evidence for the readiness of the product for the market.

JEDEC JEP148-2004由(美国)固态技术协会,隶属EIA US-JEDEC 发布于 2004-04-01。

JEDEC JEP148-2004 在中国标准分类中归属于: L40 半导体分立器件综合，在国际标准分类中归属于: 31.080 半导体分立器件。

JEDEC JEP148-2004的历代版本如下：

• 2004年04月01日 JEDEC JEP148-2004 基于故障风险的物理性和选择评估的半导体器件的鉴定

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标准号

JEDEC JEP148-2004

发布日期

2004年04月01日

实施日期

废止日期

无

中国标准分类号

L40

国际标准分类号

31.080

发布单位

US-JEDEC

适用范围

The penetration of semiconductor products into an increasing variety of application segments together with the economic forces of cost and time-to-market require efficient qualification concepts. This requirement influences the organization of the qualification process in conjunction with the development / innovation process as well as the qualification methodology. Proactive practices such as advance quality planning, "incremental qualification" and confirmation during development have to be practiced in order to meet time to market goals. Results of theses activities including the use of further available knowledge will be the basis for the qualification as evidence for the readiness of the product for the market.

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