DIN EN 60747-5-3-2003 半导体分立器件和集成电路.第5-3部分:光电器件.测量方法 (IEC 60747-5-3:1997 + A1:2002); 德文版本 EN 60747-5-3:2001 + A1:2002
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices; Measuring methods (IEC 60747-5-3:1997 + A1:2002); German version EN 60747-5-3:2001 + A1:2002