BS DD ISO/TS 13762-2002
粒径分析.小角度X射线散射法

Particle size analysis - Small angle X-ray scattering method

BS DD ISO/TS 13762-2002 发布历史

This Technical Specification specifies the method for determining particle size distribution of ultra-fine powders by the small angle X-ray scattering technique. It is applicable to particle sizes ranging from 1 nm to 300 nm. In the data analysis, it is assumed that particles are isotropic and spherically shaped. The method described in this Technical Specification is also applicable to particle suspensions. This Technical Specification does not apply to: a) powders containing particles whose morphology is far from spherical, except by special agreement; b) powders consisting of porous particles; c) mixtures of powders.

BS DD ISO/TS 13762-2002由英国标准学会 GB-BSI 发布于 2002-12-04，并于 2002-12-04 实施。

BS DD ISO/TS 13762-2002 在中国标准分类中归属于: N50 物质成份分析仪器与环境监测仪器综合，在国际标准分类中归属于: 19.120 粒度分析、筛分。

BS DD ISO/TS 13762-2002的历代版本如下：

• 2002年12月04日 BS DD ISO/TS 13762-2002 粒径分析.小角度X射线散射法

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标准号

BS DD ISO/TS 13762-2002

发布日期

2002年12月04日

实施日期

2002年12月04日

废止日期

无

中国标准分类号

N50

国际标准分类号

19.120

发布单位

GB-BSI

适用范围

This Technical Specification specifies the method for determining particle size distribution of ultra-fine powders by the small angle X-ray scattering technique. It is applicable to particle sizes ranging from 1 nm to 300 nm. In the data analysis, it is assumed that particles are isotropic and spherically shaped. The method described in this Technical Specification is also applicable to particle suspensions. This Technical Specification does not apply to: a) powders containing particles whose morphology is far from spherical, except by special agreement; b) powders consisting of porous particles; c) mixtures of powders.