IEC 60749-32 Edition 1.1-2010
半导体器件.机械和气候试验方法.第32部分:塑料密封器件的易燃性(外部感应)

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

IEC 60749-32 Edition 1.1-2010 发布历史

This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. NOTE This test is identical to the test method contained in 1.2 of chapter 4 of IEC 60749 (1996), apart from the addition of this clause, the addition of titles to clauses 2 and 3 and renumbering.

IEC 60749-32 Edition 1.1-2010由国际电工委员会 IX-IEC 发布于 2010-11-01，并于 2010-11-01 实施。

IEC 60749-32 Edition 1.1-2010 在中国标准分类中归属于: L40 半导体分立器件综合，在国际标准分类中归属于: 31.080.01 半导体器分立件综合。

IEC 60749-32 Edition 1.1-2010的历代版本如下：

• 2010年11月01日 IEC 60749-32 Edition 1.1-2010 半导体器件.机械和气候试验方法.第32部分:塑料密封器件的易燃性(外部感应)

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标准号

IEC 60749-32 Edition 1.1-2010

发布日期

2010年11月01日

实施日期

2010年11月01日

废止日期

无

中国标准分类号

L40

国际标准分类号

31.080.01

发布单位

IX-IEC

适用范围

This part of IEC 60749 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. NOTE This test is identical to the test method contained in 1.2 of chapter 4 of IEC 60749 (1996), apart from the addition of this clause, the addition of titles to clauses 2 and 3 and renumbering.