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4.1 The purpose of this test method is to define a procedure for testing components being considered for installation into a high-purity gas distribution system. Application of this test method is expected to yield comparable data among components tested for purposes of qualification for this installation.
1.1 This test method covers the testing of interior surfaces of components such as tubing, fittings, and valves for surface morphology.
1.2 This test method applies to all surfaces of tubing, connectors, regulators, valves, and any metal component, regardless of size.
1.3.1 This methodology assumes a SEM operator skill level typically achieved over a 12-month period.
1.3.2 This test method shall be limited to the assessment of pits, stringer, tears, grooves, scratches, inclusions, stepped grain boundaries, and other surface anomalies. However, stains and particles that may be produced during specimen preparation should be excluded in the assessment of anomalies.
1.4 The values stated in SI units are to be regarded as the standard. The inch-pound units given in parentheses are for information only.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific hazard statements are given in Section 6.
扫描式电子显微镜,其系统设计由上而下,由电子枪 (Electron Gun) 发射电子束,经过一组磁透镜聚焦 (Condenser Lens) 聚焦后,用遮蔽孔径 (Condenser Aperture) 选择电子束的尺寸(Beam Size)后,通过一组控制电子束的扫描线圈,再透过物镜 (Objective Lens) 聚焦,打在样品上,在样品的上侧装有讯号接收器,用以择取二次电子 (Secondary...
04、扫描式电子显微镜,其系统设计由上而下,由电子枪 (Electron Gun) 发射电子束,经过一组磁透镜聚焦 (Condenser Lens) 聚焦后,用遮蔽孔径 (Condenser Aperture) 选择电子束的尺寸(Beam Size)后,通过一组控制电子束的扫描线圈,再透过物镜 (Objective Lens) 聚焦,打在样品上,在样品的上侧装有讯号接收器,用以择取二次电子 (Secondary...
04扫描式电子显微镜,其系统设计由上而下,由电子枪 (Electron Gun) 发射电子束,经过一组磁透镜聚焦 (Condenser Lens) 聚焦后,用遮蔽孔径 (Condenser Aperture) 选择电子束的尺寸(Beam Size)后,通过一组控制电子束的扫描线圈,再透过物镜 (Objective Lens) 聚焦,打在样品上,在样品的上侧装有讯号接收器,用以择取二次电子 (Secondary...
第四条:扫描式电子显微镜,其系统设计由上而下,由电子枪 (Electron Gun) 发射电子束,经过一组磁透镜聚焦 (Condenser Lens) 聚焦后,用遮蔽孔径 (Condenser Aperture) 选择电子束的尺寸(Beam Size)后,通过一组控制电子束的扫描线圈,再透过物镜 (Objective Lens) 聚焦,打在样品上,在样品的上侧装有讯号接收器,用以择取二次电子 (Secondary...
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