IEC/PAS 60512-27-200-2018

Connectors for electrical and electronic equipment - Tests and measurements - Part 27-200: Additional specifications for signal integrity tests up to 2000 MHz on IEC 60603-7 series connectors - Tests 27a to 27g

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标准号

IEC/PAS 60512-27-200-2018

发布日期

2018年10月

实施日期

废止日期

无

国际标准分类号

31.220.10

发布单位

IX-IEC

引用标准

IEC 60050-581-2008 IEC 60512-1-2001 IEC 60512-26-100-2008 IEC 60512-27-100-2011 IEC 60512-28-100-2013 IEC 60603-7-2008 IEC 60603-7-1-2011 IEC 60603-7-2-2010 IEC 60603-7-3-2010 IEC 60603-7-4-2010 IEC 60603-7-5-2010 IEC 60603-7-41-2010 IEC 60603-7-51-2010 IEC 60603-7-81-2015 IEC 61156-1-2007 IEC 61156-9-2016 IEC 61156-10-2016 IEC 61169-16-2006 IEC 61935-1-2015 IEC 61935-2-2010 ISO/IEC 11801-1-2017 ITU-T G.117-1996

被代替标准

IEC 48B/2652/DPAS-2018

适用范围

This part of IEC 60512 covers additional, supplemental specifications for signal integrity and transmission performance test methods of IEC 60512-27-100, for connectors using de- embedded crosstalk measurements, which are specified in respective parts of IEC 60603-7 standards for connecting hardware applications up to 2000 MHz. These additional specifications are also applicable for testing the related lower frequency connectors. However, the test methodology specified in the detail specification for any given connector remains the reference conformance test for that connector. Test procedures of IEC 60512-27-100 affected by these supplemental methods and procedures are: insertion loss, test 27a; return loss, test 27b; near-end crosstalk (NEXT) test 27c; far-end crosstalk (FEXT), test 27d; transverse conversion loss (TCL), test 27f; transverse conversion transfer loss (TCTL), test 27g. Other test procedures referenced here are; transfer impedance (ZT), see test procedures in IEC 62153-4-6 or IEC 62153-4-7; for coupling attenuation (aC), see test procedures in IEC 62153-4-7 or IEC 62153-4-12.