31.020 电子元器件综合 标准查询与下载

ASTM E1250-15 评定硅电子器件辐射强度试验用钴60辐射源的低能伽马成分的电离箱应用的标准试验方法

4.1 Although Co-60 nuclei only emit monoenergetic gamma rays at 1.17 and 1.33 MeV, the finite thickness of sources, and encapsulation materials and other surrounding structures that are inevitably present in irradiators can contribute a substantial amount of low-energy gamma radiation, principally by Compton scattering (1, 2).3 In radiation-hardness testing of electronic devices this low-energy photon component of the gamma spectrum can introduce significant dosimetry errors for a device under test since the equilibrium absorbed dose as measured by a dosimeter can be quite different from the absorbed dose deposited in the device under test because of absorbed dose enhancement effects (3, 4). Absorbed dose enhancement effects refer to the deviations from equilibrium absorbed dose caused by non-equilibrium electron transport near boundaries between dissimilar materials. 4.2 The ionization chamber technique described in this method provides an easy means for estimating the importance of the low-energy photon component of any given irradiator type and configuration. 4.3 When there is an appreciable low-energy spectral component present in a particular irradiator configuration, special experimental techniques should be used to ensure that dosimetry measurements adequately represent the absorbed dose in the device under test. (See Practice E1249.) 1.1 Low energy components in the photon energy spectrum of Co-60 irradiators lead to absorbed dose enhancement effects in the radiation-hardness testing of silicon electronic devices. These low energy components may lead to errors in determining the absorbed dose in a specific device under test. This method covers procedures for the use of a specialized ionization chamber to determine a figure of merit for the relative importance of such effects. It also gives the design and instructions for assembling this chamber. 1.2 This method is applicable to measurements in Co-60 radiation fields where the range of exposure rates is 78201;×8201;10 −6 to 38201;×8201;10−2 C kg −1 s−1 (approximately 100 R/h to 100 R/s). For guidance in applying this method to radiation fields where the exposure rate is >100 R/s, see Appendix X1. Note 1: See Terminology E170 for definition of exposure and its units. 1.3 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only. 1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropr......

Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

GSO IEC 60286-5:2014 自动交易包装原料 第5部分：矩阵托盘

This part of IEC 60286 describes the common dimensions, tolerances and characteristics of the tray. It includes only those dimensions which are essential for the handling of the trays for the stated purpose and for placing or removing components from the trays. Matrix trays are designed to facilitate the transport and handling of electronic components during their testing, baking, transport/storage, and final mounting by automatic placement equipment. The generic rules for their design are given in this standard.. Newly developed trays which follow these rules will not be listed individually . Only those trays which conform to the design rules set forth herein are classified as “standard trays” and are thus preferred for use. NOTE Matrix trays listed in Annex A which do not conform to the design rules set forth herein shall be considered as “non-standard trays” and are not preferred for use.

Packaging of components for automatic handling - Part 5: Matrix trays

GSO IEC/PAS 62435:2014 电子元件 电子元件的长期储存 应用指南（实施）

This Publicly Available Specification (PAS) is, first of all, a practical guide to methods of longduration storage (more than five years) which summarizes the existing practices in the industry. Unless otherwise specified, the approach, as well as the methods presented, apply to all families of electronic components, such as ¾ passive components, including quartz crystals, connectors and relays. However, components with \"manufacturer\'s\" specifications showing an expiry date or specific storage conditions are excluded from this document (for example, primary cells, storage cells, etc.); ¾ encapsulated or non-encapsulated active components of a silicon [Si] or gallium arsenide [GaAs] technology; ¾ micro-electronic assemblies.

Electronic components - Long-duration storage of electronic components - Guidance for implementation

GSO IEC 61709:2014 电子元件 可靠性 故障率参考条件和转换应力模型

This International Standard gives guidance on how failure rate data can be employed for reliability prediction of electric components in equipment. Reference conditions are numerical values of stresses that are typically observed by components in the majority of applications. Reference conditions are useful since they are the basis of the calculation of failure rate under any conditions by the application of stress models that take into account the actual operating conditions. Failure rates stated at reference conditions allow realistic reliability predictions to be made in the early design phase. The stress models described herein are generic and can be used as a basis for conversion of the failure rate data at these reference conditions to actual operating conditions when needed and this simplifies the prediction approach. Conversion of failure rate data is only permissible within the specified functional limits of the components. This standard also gives guidance on how a database of component failure data can be constructed to provide failure rates that can be used with the included stress models. Reference conditions for failure rate data are specified, so that data from different sources can be compared on a uniform basis. If failure rate data are given in accordance with this International Standard then no additional information on the specified conditions is required. This standard does not provide base failure rates for components – rather it provides models that allow failure rates obtained by other means to be converted from one operating condition to another operating condition. The prediction methodology described in this standard assumes that the parts are being used within its useful life. The methods in this standard have a general application but are specifically applied to a selection of component types as defined in Clause 6 and Clause E.2.

Electric components - Reliability - Reference conditions for failure rates and stress models for conversion

GSO IEC 60286-6:2014 用于自动处理的包装组件 第6部分：表面贴装组件的体积盒包装

This part of IEC 60286 is applicable to bulk case packaging capable of containing surface mounting components. The bulk case is designed for transport and storage of components and the supply of components directly or by an appropriate feeder to the placement machine. The bulk case is attached to the automatic handling machine by means of a coupling interface. NOTE For size limitations of components, see Annex A, Tables A.1, A.2 and A.3.

Packaging of components for automatic handling - Part 6: Bulk case packaging for surface mounting components

GSO IEC/TR 62152:2014 级联双端口或四极的传输特性 术语和定义的背景

It is important and practical that components of a transmission chain can be separated and tested separately. To accomplish this, well-defined interfaces and measuring techniques, including agreed terms and definitions, are required. This technical report has two main goals. It lays the foundation for agreement on the fundamental terms and definitions to be used world-wide in describing the transmission properties of a two-port or quadripole. The report builds a bridge between the classical quadripole theory and the scattering matrix presentation which is based on incident and reflecting square root of power waves at the input and output of a two-port. Finally, it is shown that the two concepts are bound together through simple equations and are fundamentally identical. The quadripole theory was originally developed for voice- and carrier-frequency technologies and transmission, and later for microwaves, but both can be used through the whole frequency range.

Transmission properties of cascaded two-ports or quadripols - Background of terms and definitions

GSO IEC 60294:2014 测量带轴向端的圆柱形部件的尺寸

This International Standard applies to cylindrical capacitors and resistors for use in electronic equipment. This standard gives methods for measurement of the body length and for checking the excessive protective coating extending onto the wire terminations of components with axial wire terminations. It further provides a method for checking the overall body diameter of cylindrical components with axial wire terminations. NOTE A measuring method for components with unidirectional terminations is given in IEC 60717.

Measurement of the dimensions of a cylindrical component with axial terminations

GSO IEC 61360-2:2014 电气元件分类软件中的标准数据元素类型 第2部分：快速词典软件

This part of IEC 61360 series provides a formal model for data according to the scope as given in IEC 61360-1 and ISO 13584-42, and thus provides a means for the computersensible representation and exchange of such data. The intention is to provide a common information model for the work of IEC SC3D and ISO TC184/SC4, thus allowing for the implementation of dictionary systems dealing with data delivered according to either of the standards elaborated by both committees. The scope of this part of IEC 61360 is the common ISO/IEC dictionary schema based on the intersection of the scopes of the two base standards IEC 61360-1 and ISO 13584-42. The presented EXPRESS model represents a common formal model for the two standards and facilitates a harmonization of both. The IEC 61360-2 forms the master document. ISO 13584-42 contains a copy of the IEC 61360-2 EXPRESS model in an informative annex In a number of clauses, where the common EXPRESS model allows more freedom, IEC has defined more restrictions which are found in the methodology part of IEC 61360-1. Two schemas are provided in this part of IEC 61360 defining the two options that may be selected for an implementation. Each of these options is referred to as a conformance class. – The ISO13584_IEC61360_dictionary_schema2 provides for modelling and exchanging technical data element types with associated classification scheme used in the data element type definitions. It constitutes conformance class 1 of this part of IEC 61360. – The ISO13584_IEC61360_language_resource_schema provides resources for permitting strings in various languages. It has been extracted from the dictionary schema, since it could be used in other schemata. It is largely based on the support_resource_schema from ISO 10303-41:2000, and can be seen as an extension to that. It allows for the usage of one specific language throughout an exchange context (physical file) without the overhead introduced when multiple languages are used. When used together with ISO 10303-21, each schema defines one single exchange format. The exchange format defined by conformance class 1 is fully compatible with the ISO 13584 series.

Standard data element types with associated classification scheme for electric components - Part 2: EXPRESS dictionary schema

IECQ 04-3-2-2014 IEC电子元器件质量评定体系 (IECQ体系). 标准培训. 第3-2部分: 用于进行IECQ AC-AQP培训的标准操作程序

IEC Quality Assessment System for Electronic Components (IECQ System) - Standard Training - Part 3-2: Standard operational procedures for conducting IECQ AC-AQP Training

IECQ 03-3-2-2014 电子元器件的IEC质量评价体系(IECQ体系).程序规则.第3-2部分:IECQ批准的元件产品,相关材料和组装件计划,IECQ批准组件.汽车认证课程(IECQ AC-AQP)

IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure - Part 3-2: IECQ Approved Component Products, Related Materials & Assemblies Scheme, IECQ Approved Component - Automotive Qualification Programme (IECQ AC-AQP)

DB34/T 2193-2014 电子电气产品聚合物材料中六价铬的测定 离子色谱法

本标准规定了电子电气产品聚合物材料中六价铬离子色谱法测定方法。 本标准适用于电子电气产品聚合物材料中六价铬的测定。

Determination of hexavalent chromium in polymer materials for electrical and electronic products by ion chromatography

NF C90-710-1*NF EN 61760-1:2014 表面安装技术.第1部分:表面安装部件(SMDs)规范的标准方法

Surface mounting technology - Part 1 : standard method for the specification of surface mounting components (SMDs)

NF C93-115/A1:2014 自动搬运用部件的包装. 第5部分: 矩阵盘

Packaging of components for automatic handling - Part 5 : matrix trays

SJ/T 11468-2014 电子电气产品有害物质限制使用 术语

本标准界定了电子电气产品有害物质限制使用领域相关术语和定义。本标准适用于电子电气产品有害物质限制使用相关领域。

Restriction of hazardous substances in electrical and electronic products.Terminology

IECQ 03-4-2014 IEC电子元器件质量评定体系 (IECQ体系). 程序规则. 第4部分: IECQ航空电子方案. 航空电子零件和装配管理

IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure - Part 4: IECQ AVIONICS Scheme - Avionics Parts and Assembly Management

SAE AS6496-2014 欺诈/假冒电子零件: 废止, 检测, 缓解以及处置. 授权/特许经营

This SAE Aerospace Standard (AS) identifies the requirements for mitigating counterfeit products in the Authorized Distribution supply chain by the Authorized Distributor. If not performing Authorized Distribution, such as an Authorized Reseller, Broker, or Independent Distributor, refer to another applicable SAE standard.

Fraudulent/Counterfeit Electronic Parts: Avoidance, Detection, Mitigation, and Disposition - Authorized/Franchised Distribution

GSO IEC 60062:2014 电阻器和电容器的标记符号

IEC 60062:2004 specifies marking codes for resistors and capacitors and indexes for the dielectric material and the electrodes of plastic film and paper capacitors. This edition includes the following significant technical changes with respect to the previous edition: a) completion of the existing code systems for - resistors with a three-character code system and a four-character code system; - temperature coefficient of resistance with a letter code system; - data code system for capacitors and resistors with the 10-year cycle code (two-character code), the 20-year cycle code (four-digit code), the 10-year cycle code (four-digit code), and a one-character code - four-year cycle. b) extension with a code letter system for the dielectric material of plastic film and paper capacitors.

Marking codes for resistors and capacitors

IECQ 01-2014 电子元器件用IEC质量评估体系(IECQ体系).基本规则

IEC quality assessment system for electronic components (IECQ system) - Basic rules

IECQ CS 033200-TW0001-2014 电子元件用IEC质量评估体系(IECQ体系). 元件规格. 触控面板. 电阻式触控面板

IEC Quality Assessment System for Electronic Components (IECQ System) - Component specification - Touch panels - Resistive touch panel

IECQ 03-5-2014 电子元器件的IEC质量评价体系(IECQ体系).程序规则.第5部分:IECQ HSPM计划.有害物质过程管理要求

IEC Quality Assessment System for Electronic Components (IECQ System) - Rules of Procedure - Part 5: IECQ HSPM Scheme - Hazardous Substance Process Management Requirements