G04 基础标准与通用方法 标准查询与下载
共找到 1687 条与 基础标准与通用方法 相关的标准，共 113 页
이 표준은 화학 제품에 대한 항목, 내용 및 안전 보건 자료(SDS)의 일반 형식을 정의한
Safety data sheet for chemical products-Content and order of sections
- ICS
- 71.100.10
- CCS
- G04
- 发布
- 2011-12-14
- 实施
- 2011-12-14
Technical Specifications for Testing of Imported and Exported Hazardous Chemicals Part 4: Flammable Solids, Pyrophoric Combustibles and Wet Flammables
- ICS
- CCS
- G04
- 发布
- 2011-12-01
- 实施
- 2011-12-01
Part 7 of the Technical Specifications for the Testing of Import and Export Hazardous Chemicals: Corrosive Products
- ICS
- CCS
- G04
- 发布
- 2011-12-01
- 实施
- 2011-12-01
Import and Export of Hazardous Chemicals Testing Technical Specifications Part 2: Gases
- ICS
- CCS
- G04
- 发布
- 2011-12-01
- 实施
- 2011-12-01
Technical Specifications for Testing of Hazardous Chemicals for Import and Export Part 3: Flammable Liquids
- ICS
- CCS
- G04
- 发布
- 2011-12-01
- 实施
- 2011-12-01
Import and Export of Hazardous Chemicals Testing Technical Specifications Part 5: Oxidizing Agents and Organic Peroxides
- ICS
- CCS
- G04
- 发布
- 2011-12-01
- 实施
- 2011-12-01
Import and export of hazardous chemicals testing technical specification part 6: acute toxicity
- ICS
- CCS
- G04
- 发布
- 2011-12-01
- 实施
- 2011-12-01
Nanotechnologies - Vocabulary - Part 4: Nanostructured materials
- ICS
- 01.040.07;07.030
- CCS
- G04
- 发布
- 2011-12
- 实施
This International Standard specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using Auger electron spectroscopy (AES). It includes information that is to be recorded on or in the analytical record.
Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2011-12
- 实施
This International Standard specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X-ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2011-12
- 实施
Nanotechnologies - Vocabulary - Part 5: Nano/bio interface
- ICS
- 01.040.07;07.030
- CCS
- G04
- 发布
- 2011-12
- 实施
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2011-11-30
- 实施
- 2011-11-30
Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- ICS
- 71.040.50
- CCS
- G04
- 发布
- 2011-11-30
- 实施
- 2011-11-30
이 표준은 검정곡선 방법을 이용해 기타 합금 원소(질량분율이 1 % ∼2 % 미만)를 포함
Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
- ICS
- 71.040.50
- CCS
- G04
- 发布
- 2011-11-28
- 实施
- 2011-11-28
이 표준은 스플릿 빔 현미경을 이용하여 알루미늄 및 알루미늄 합금의 양극산화피막 두께를 측
Anodizing of aluminium and its alloys－Determination of thickness of anodic oxidation coatings－Non-destructive measurement by split-beam microscope
- ICS
- 25.220.20
- CCS
- G04
- 发布
- 2011-11-02
- 实施
- 2011-11-02
This International Standard describes procedures for measuring average grain size derived from a twodimensional polished cross-section using electron backscatter diffraction (EBSD). This requires the measurement of orientation, misorientation and pattern quality factor as a function of position in the crystalline specimen[1]. NOTE 1 While conventional methods for grain size determination using optical microscopy are well-established, EBSD methods offer a number of advantages over these techniques, including increased spatial resolution and quantitative description of the orientation of the grains. The method also lends itself to the measurement of the grain size of complex materials, for example those with NOTE 2 a significant duplex content. The reader is warned to interpret the results with care when attempting to investigate specimens with high NOTE 3 levels of deformation.
Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
- ICS
- 71.040.50
- CCS
- G04
- 发布
- 2011-11
- 实施
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
- ICS
- 71.040.40
- CCS
- G04
- 发布
- 2011-11
- 实施
Nanotechnologies - Materials specifications - Guidance on specifying nano-objects
- ICS
- 07.030
- CCS
- G04
- 发布
- 2011-11
- 实施
