L50 光电子器件综合 标准查询与下载

SJ 50033/113-1996 半导体光电子器件.GD3252Y型光电二极管详细规范

Semiconductor optoelectronic devices.Detail specification for type GD3252Y photodiodes

SJ 50033/109-1996 半导体光电子器件.GJ9031T、GJ9032T和GJ9034T型半导体激光二极管.详细规范

Semiconductor optoelectronic devices.Detail specification for types GJ9031T and GJ9032T and GJ9034T semiconductor laser diodes

SJ 50033/110-1996 半导体光电子器件GR9413型红外发射二极管详细规范

Semiconductor optoelectronic devices.Detail specification for type GR9413 infrared light emitting diode

SJ 50033/112-1996 半导体光电子器件.GD3251Y型光电二极管详细规范

Scmiconductor optoelectronic devices.Detail specification for type GD3251Y photodiodes

SJ 50033/114-1996 半导体光电子器件.GD3283Y型位敏探测器详细规范

Semiconductor optoelectronic devices.Detail specification for type GD3283Y position sensitive detector

BS EN 61194:1996 独立式光电系统特征参数

Defines the major electrical, mechanical and environmental parameters for the description and performance analysis of stand-alone photovoltaic (PV) systems.

Characteristic parameters of stand-alone photovoltaic (PV) systems

SJ 50033/102-1995 GD218型InGaAs/InP PIN 光电二极管详细规范

Detail specification for InGaAs/InP PIN photodiode for type GD 218

SJ 50923/1-1995 A6-02A-M2(Z2)和A6-01B-M1(Z1) 型半导体光耦合器金属外壳详细规范

Detail specification for types A6-02A-M2（Z2）and A6-01B-M1（Z1）metal case for semiconductor photocouplers

JEDEC JESD32-1996 块瓷使用说明文件标准

This standard was developed to define a Chain Description File that specifies protocol required to support in-circuit programming. The need for in-circuit programming is driven by high density devices with small lead pitches and high pin count, which are difficult to handle without damage. It is also evolving into a preferred prototyping and debugging environment.

Standard for China Description File

JEDEC JESD35-2-1996 测定薄电介质的维夫-水平试验（Wafer-Level）测试准则.JESD35的No.2附录

This addendum expands the usefulness of the JEDEC Standard No. 35 (JESD35) by detailing an alternative method of determining the end point of the voltage ramp test and expanding the range for determination of the end point for the current ramp test.

Test Criteria for the Wafer-Level Testing of Thin Dielectrics Addendum No. 2 to JESD35

BS EN 61727:1996 光伏（PV）系统 实用程序接口的特征

Recommendations for power quality, PV system equipment protection and personal safety.

Photovoltaic (PV) systems. Characteristics of the utility interface

ANSI/TIA/EIA 455-129-1996 将人体模型静电放电应力应用到封装的光电组件的程序

Specifies test procedures used to apply simulated electrostatic discharge (ESD) stress to packaged optoelectronic components for the purpose of measuring the degree of vulnerability of these components to statice discharge that naturally occurs in the environment.

Procedure for Applying Human Body Model Electrostatic Discharge Stress to Packaged Optoelectronic Components

ASTM E1802-96 光电模件的隔湿组件试验的标准测试方法

1.1 These test methods provide procedures to determine the insulation resistance of a photovoltaic (PV) module, i.e. the electrical resistance between the module''s internal electrical components and its exposed, electrically conductive, non-current carrying parts and surfaces.1.2 The insulation integrity procedures are a combination of wet insulation resistance and wet dielectric voltage withstand test procedures.1.3 These procedures are similar to and reference the insulation integrity test procedures described in Test Methods E 1462, with the difference being that the photovoltaic module under test is immersed in a wetting solution during the procedures.1.4 These test methods do not establish pass or fail levels. The determination of acceptable or unacceptable results is beyond the scope of these test methods.1.5 The values stated in SI units are to be regarded as the standard.1.6 There is no similar or equivalent ISO standard.1.7 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. For specific precautionary statements, see Section 6.

Standard Test Methods for Wet Insulation Integrity Testing of Photovoltaic Modules

IEEE 1262-1995 光致电压(PV)系数验证合格的推荐实例

Establishes recommended procedures and specifications for qualification tests that are structured to evaluate terrestrial flat-plate photovoltaic nonconcentrating modules intended for power generation applications.

Recommended practice for qualification of photovoltaic (PV) modules

JEDEC JESD35-1-1995 JESD35的补遗1－薄电介质的Wafer-Level测试的设计测试结构的一般指南

The JESD35 describes voltage and current ramp tests for characterizing the integrity of thin dielectrics in MOS microelectronics. Two parameters, the breakdown electric field and the charge density to breakdown, are typically extracted fiom the test results and used as a measure of dielectric quality. The validity and accuracy of these parameters are dependent on the layout of the thin oxide test structure, test equipment accuracy, and environmental conditions. It is therefore important to understand the various sources of error that can be introduced by the above factors.

General Guidelines for Designing Test Structures for the Wafer-Level Testing of Thin Dielectrics Addendum No. 1 to JESD35

IEC 60904-8:1995 光电器件.第8部分:光电器件的光谱反应的测量导则

Photovoltaic devices - Part 8: Guidance for the measurement of spectral response of a photovoltaic (PV) device

IEC 60904-7:1995 光电器件.第7部分:光电器件检验中对失配误差的计算

Photovoltaic devices - Part 7: Computation of spectral mismatch error introduced in the testing of a photovoltaic device

IEC 60747-12-1:1995 半导体器件 第12部分:光电子器件 第2节:纤维光学系统和子系统用带/不带尾纤的光发射或红外发射二极管空白详细规范

Semiconductor devices - Part 12: Optoelectronic devices - Section 1: Blank detail specification for light emitting/infrared emitting diodes with/without pigtail for fibre optic systems or sub-systems

IEC 60747-12-2:1995 半导体器件 第12部分:光电子器件 第2节:纤维光学系统和子系统带尾纤的激光二极管模块空白详细规范

Semiconductor devices - Part 12: Optoelectronic devices - Section 2: Blank detail specification for laser diode modules with pigtail for fibre optic systems and sub-systems

IEC 61727:1995 光伏系统 电网接口的特性

Photovoltaic (PV) systems - Characteristics of the utility interface