L55 微电路综合 标准查询与下载



共找到 928 条与 微电路综合 相关的标准,共 62

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16K X 8-BIT ULTRA VIOLET ERASABLE PROGRAMMABLE READ ONLY MEMORY (UVEPROM), MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2006-09-29
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR, 256 X 9-BIT RAM, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2006-09-28
实施

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, 12-BIT SERIAL DACPORT, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2006-08-30
实施

This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar applications (device class T). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. For device class T, the user is encouraged to review the manufacturer’s Quality Management (QM) plan as part of their evaluation of these parts and their acceptability in the intended application.

MICROCIRCUIT, DIGITAL-LINEAR, RADIATION HARDENED DUAL INVERTING MOSFET DRIVER, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2006-08-24
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, MEMORY, BIPOLAR, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2006-08-18
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, DUAL, HIGH-SPEED, VOLTAGE COMPARATOR, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2006-08-16
实施

本标准规定了集成电路(IC)的电流锁定和过压锁定的试验方法。 本标准的目的是建立测试IC锁定试验的方法,用来判断集成电路锁定特性并确定锁定的失效判据。锁定敏感性对于决定产品可靠性、最小无故障率(NTF)和过电应力失效(EOS)非常重要。 本试验方法适用于NMOS、CMOS、双级以及各种使用此类工艺的产品。当器件被置于该试验方法下出现锁定时,表明器件电性能失效,与器件特殊结构无关。

Integrated circuits latch-up test

ICS
31.200
CCS
L55
发布
2006-08-07
实施
2006-12-30

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, HYBRID, H-BRIDGE, PULSE WIDTH MODULATOR MOTOR DRIVER/AMPLIFIER

ICS
31.200
CCS
L55
发布
2006-08-01
实施

This part of IEC 62258 has been developed to facilitate the production, supply and use of semiconductor die products, including: – wafers; – singulated bare die; – die and wafers with attached connection structures; – minimally or partially encapsulated die and wafers. This part of IEC 62258 specifies the information required to facilitate the use of electrical data and models for simulation of the electrical behaviour and verification of the correct functionality of electronic systems that include bare semiconductor die, with or without connection structures, and/or minimally packaged semiconductor die. It is intended to assist all those involved in the supply chain for die devices to comply with the requirements of IEC 62258-1 and IEC 62258-2.

Semiconductor die products - Part 5: Requirements for information concerning electrical simulation

ICS
31.080.99;31.200
CCS
L55
发布
2006-08
实施
2006-08-30

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, OPERATIONAL AMPLIFIER, WIDEBAND, HIGH SLEW RATE/ OUTPUT CURRENT, MONOLITHIC SILICON

ICS
CCS
L55
发布
2006-07-31
实施

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, HYBRID, LINEAR, DIGITAL TO ANALOG CONVERTER, 12-BIT

ICS
CCS
L55
发布
2006-07-24
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, LINEAR, AC PLASMA DISPLAY DRIVERS, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2006-07-07
实施

This drawing documents five product assurance classes as defined in paragraph 1.2.3 and MIL-PRF-38534. A choice of case outlines and lead finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

MICROCIRCUIT, LINEAR, SAMPLING A/D CONVERTER, 16-BIT RESOLUTION, MONOLITHIC SILICON

ICS
CCS
L55
发布
2006-07-06
实施

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M)and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

MICROCIRCUIT, LINEAR, RADIATION HARDENED, 8-BIT, HIGH SPEED, MULTIPLYING D/A CONVERTER, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2006-06-19
实施

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN

MICROCIRCUIT, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, 4-BIT MAGNITUDE COMPARATORS, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2006-06-14
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2K X 8 BIT, ONE TIME PROGRAMMABLE (OTP) PROM, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2006-06-12
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 8K X 8 UV EPROM, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2006-06-06
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2K X 8 BIT, ONE TIME PROGRAMMABLE (OTP) REGISTERED PROM, MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2006-06-06
实施

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR 256 X 8-BIT RANDOM ACCESS MEMORY (RAM), MONOLITHIC SILICON

ICS
31.200
CCS
L55
发布
2006-05-16
实施

This proposed standard builds upon the VXS proposed standard by describing how VXS boards may communicate in a compatible way using the InfiniBand protocol. Pinouts for both the payload and switch boards are given, as well as the value of the VXS key which indicates this protocol.

VXS 4X InfiniBand Protocol

ICS
35.200
CCS
L55
发布
2006-05-04
实施



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