N04 基础标准与通用方法 标准查询与下载

AIR FORCE A-A-59754-2004 信号产生器(10兆 赫至20吉赫)

This Commercial Item Description, (CID), describes a 10 MHz to 20 GHz a synthesized microwave source with a Continuous Wave (CW), Analog, Alternate, Manual, and List Sweep Modes. The equipment shall be capable of providing Amplitude Modulation (AM), Fre

GENERATOR, SIGNAL (10 MHZ TO 20 GHZ)

ASTM D6708-04 测量材料相同性质的两种试验方法间预期一致性的改进和统计学评估的标准实施规范

1.1 This practice defines statistical methodology for assessing the expected agreement between two standard test methods that purport to measure the same property of a material, and deciding if a simple linear bias correction can further improve the expected agreement. It is intended for use with results collected from an interlaboratory study meeting the requirement of Practice D 6300 or equivalent (for example, ISO 4259). The interlaboratory study must be conducted on at least ten materials that span the intersecting scopes of the test methods, and results must be obtained from at least six laboratories using each method.Note 1--Examples of standard test methods are those developed by voluntary consensus standards bodies such as ASTM, IP/BSI, DIN, AFNOR, CGSB.1.2 The statistical methodology is based on the premise that a bias correction will not be needed. In the absence of strong statistical evidence that a bias correction would result in better agreement between the two methods, a bias correction is not made. If a bias correction is required, then the parsimony principle is followed whereby a simple correction is to be favored over a more complex one.Note 2--Failure to adhere to the parsimony principle generally results in models that are over-fitted and do not perform well in practice.1.3 The bias corrections of this practice are limited to a constant correction, proportional correction or a linear (proportional + constant) correction.1.4 The bias-correction methods of this practice are method symmetric, in the sense that equivalent corrections are obtained regardless of which method is bias-corrected to match the other.1.5 A methodology is presented for establishing the 95 % confidence limit (designated by this practice as the cross-method reproducibility) for the difference between two results where each result is obtained by a different operator using different apparatus and each applying one of the two methods X and Y on identical material, where one of the methods has been appropriately bias-corrected in accordance with this practice.Note 3--Users are cautioned against applying the cross-method reproducibility as calculated from this practice to materials that are significantly different in composition from those actually studied, as the ability of this practice to detect and address sample-specific biases (see 6.8) is dependent on the materials selected for the interlaboratory study. When sample-specific biases are present, the types and ranges of samples may need to be expanded significantly from the minimum of ten as specified in this practice in order to obtain a more comprehensive and reliable 95 % confidence limits for cross method reproducibility that adequately cover the range of sample specific biases for different types of materials.1.6 This practice is intended for test methods which measure quantitative (numerical) properties of petroleum or petroleum products.1.7 Software program CompTM Version 1.0.21 (ADJ6708) performs the necessary computations prescribed by this practice.

Standard Practice for Statistical Assessment and Improvement of the Expected Agreement Between Two Test Methods that Purport to Measure the Same Property of a Material

ASTM E1577-04 用于表面分析的离子束参数报告的标准指南

Ion beams are utilized in surface analysis in two ways. First, they can generate signals from the specimen, for example, in SIMS and ISS. Second, they can remove material from the specimen surface while a surface analytical technique determines the composition of the freshly exposed surface. This process is called sputter depth profiling. Ideally, this guide requires reporting all characteristics of the ion beam that can possibly affect the results so that the measurement can be reproduced.1.1 This guide covers the information needed to characterize ion beams used in surface analysis. 1.2 This guide does not cover all information required to perform a sputter depth profile (see referenced documents), specify any properties of the specimen except its surface normal, and discuss the rationale for choosing a particular set of ion beam parameters (1,7). This guide does assume that the ion flux has a unique direction, that is, is an ion beam, rather than a wide spectrum of velocity vectors more typical of a plasma. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis

ASTM E1767-04 材料外观特性的观察和测量的几何规定用规程

This practice is for the use of manufacturers and users of equipment for visual appraisal or measurement of appearance, those writing standards related to such equipment, and others who wish to specify precisely conditions of viewing or measuring attributes of appearance. The use of this practice makes such specifications concise and unambiguous. The functional notation facilitates direct comparisons of the geometric specifications of viewing situations and measuring instruments.1.1 This practice describes the geometry of illuminating and viewing specimens and the corresponding geometry of optical measurements to characterize the appearance of materials. It establishes terms, symbols, a coordinate system, and functional notation to describe the geometric orientation of a specimen, the geometry of the illumination (or optical irradiation) of a specimen, and the geometry of collection of flux reflected or transmitted by the specimen, by a measurement standard, or by the open sampling aperture.1.2 Optical measurements to characterize the appearance of retroreflective materials are of such a special nature that they are treated in other ASTM standards and are excluded from the scope of this practice.1.3 The measurement of transmitted or reflected light from areas less than 0.5 mm in diameter may be affected by optical coherence, so measurements on such small areas are excluded from consideration in this practice, although the basic concepts described in this practice have been adopted in that field of measurement.1.4 The specification of a method of measuring the reflecting or transmitting properties of specimens, for the purpose of characterizing appearance, is incomplete without a full description of the spectral nature of the system, but spectral conditions are not within the scope of this practice. The use of functional notation to specify spectral conditions is described in ISO 5/1.

Standard Practice for Specifying the Geometries of Observation and Measurement to Characterize the Appearance of Materials

ANSI/ISA 84.00.01-1-2004 功能安全.加工工业部门的安全仪表化系统.第1部分:框架、定义、系统、硬件和软件要求

Places requirements on the specification, design, installation, operation, and maintenance of a safety instrumented system, so that it can be confidently entrusted to place and/or maintain the process in a safe state. Developed as a process sector implementation of IEC 61508, "Functional safety of electrical/electronic/programmable electronic safety related systems."

Functional safety - Safety instrumented systems for the process industry sector - Part 1: Framework, definitions, system, hardware and software requirements.

ANSI/ISA 84.00.01-3-2004 功能安全.加工工业部门的安全仪表化系统.第3部分:所要求的安全完整性等级的测定指南.信息化

Provides information on the underlying concepts of risk, the relationship of risk to safety integrity, the determination of tolerable risk, and a number of different methods that enable the safety integrity levels for Safety Instrumented Functions to be determined. Like Parts 1 and 2, this standard was developed as a process sector implementation of IEC 61508, "Functional safety of electrical/electronic/programmable electronic safety related systems."

Functional safety - Safety instrumented systems for the process industry sector - Part 3: Guidance for the determination of the required safety integrity levels - informative

ANSI/ISA 84.00.01-2-2004 功能安全.加工工业部门的安全仪表测量系统.第2部分:应用指南.信息

The objective of this standard is to provide guidance on how to comply with IEC 61511-1, which was developed as a process sector implementation of IEC 61508, "Functional safety of electrical/electronic/programmable electronic safety related systems."

Functional safety - Safety instrumented systems for the process industry sector - Part 2: Guidelines for the application - Informative

ASTM E2332-04 物理元件故障的调查和分析的标准规程

This practice establishes procedures for the investigation and evaluation of a physical component failure. The framework and methodology outlined is not exhaustive, as evaluation of complex component failures often requires unique and/or highly specialized analytical and investigative techniques. Each of the outlined elements of the practice may not be required or possible for each component. 1.1 This standard practice for the engineering investigation and analysis of component failures covers the collection and analysis of all information and physical evidence pertaining to the failure or perceived failure of a specific component. The data and physical evidence includes but are not limited to background information regarding the design (if available), fabrication and expected service conditions of the component, evidence pertaining to the actual service history of the component, and physical evidence relating to the component failure. The nature of the use of the particular component is immaterial with respect to this standard. This standard does not apply to software.1.2 For the purpose of collecting and generating data, all values will be used with SI (English) units.This standard may involve hazardous substances and objects, operations, and equipment. This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Investigation and Analysis of Physical Component Failures

SANS 250:2003 测量管理系统．对测量过程和测量仪器的要求

This standard specifies generic requirements and provides guidance for the management of measurement processes and metrological confirmation of measuring equipment used to support and demonstrate compliance with metrological requirements.

Measurement management systems - Requirements for measurement processes and measuring equipment

BS ISO 11843-4:2003 检测能力.用最小可检测值与给定值相比对的方法

This International Standard is applicable to screens with height and length greater than 1,5 m. However, it may also be used for smaller screens provided that the interested parties come to an agreement on this.

Capability of detection - Methodology for comparing the minimum detectable value with a given value

ISO 11843-1:1997/cor 1:2003 检测能力.第1部分:术语和定义.技术勘误1

This is Technical Corrigendum 1 to ISO 11843-1-1997 (Capability of detection-Part 1: Terms and definitions)

Capability of detection - Part 1: Terms and definitions; Technical Corrigendum 1

JIS Z 8462-2 ERRATUM 1:2003 JIS Z8462-2 勘误表 1

ERRATUM

ISO 11843-4:2003 检测能力.第4部分:用最小可检测值与给定值相比对的方法

This part of ISO 11843 deals with the assessment of the capability of detection of a measurement method without the assumptions in ISO 11843-2 of a linear calibration curve and certain relationships between the residual standard deviation and the value of the net state variable NOTE These assumptions are often doubtful for values of the net state variable close to zero. Instead of estimating the minimum detectable value, this part of ISO 11843 provides — a criterion for judging whether the minimum detectable value is less than a given level of the net state variable, and — the basic experimental design for testing the conformity of this criterion. For assessment of the capability of detection, for instance as part of the validation of a measurement method, it is often sufficient to confirm that the method has a minimum detectable value that is less than a given value.

Capability of detection - Part 4: Methodology for comparing the minimum detectable value with a given value

KIT 127-2003 功能安全.安全仪器使用系统(SIS)标准汇编

Functional Safety - Safety instrumented systems (SIS) kit

NF X06-048-3*NF ISO 11843-3:2003 检测能力.第3部分:在无校准数据可采用情况下测定反应变量临界值的方法

Capability of detection - Part 3 : methodology for determination of the critical value for the response variable when no calibration data are used.

DIN 32561:2003 微型系统用生产设备.浅托盘.尺寸和公差

This Standard applies to trays which take workpeaces orderly and which can be used for storage, transport and handling with standardized handling systems and production equipment of semiconductors. This Standard specifies a uniform external design, dimensions and tolerances as well as the designation and the area for marking of those trays.

Production equipment for microsystems - Tray - Dimensions and tolerances

DLA A-A-52070 A-2003 铅锤线

This Commercial item Description (CID)is inpreference to MlL-C-43258.

CORD, PLUMB BOB

AIR FORCE A-A-50727 A-2003 信号(2吉兆赫至26吉兆赫)发射器

This Commercial Item Description (CID), describes a laboratory standard quality bench piece of electronic test equipment which is a bench-mount with rack-mount option, solidstate,general purpose, 2 GHz to 26 GHz, signal generator. This CID is meant as a

GENERATOR, SIGNAL (2 GHZ TO 26 GHZ)

BS IEC 61511-2:2003 功能安全.加工工业部门用安全仪表化系统.BS IEC 61511-1应用指南

IEC 61511-2 provides guidance on the specification, design, installation, operation and maintenance of Safety Instrumented Functions and related safety instrumented system as defined in IEC 61511-1. This standard has been organized so that each clause and subclause number herein addresses the same clause number in IEC 61511-1 (with the exception of the annexes).

Functional safety - Safety instrumented systems for the process industry sector - Guidelines for the application of BS IEC 61511-1

ISO 14594:2003 微电子束分析.电子探测微观分析.波长色散光谱学用实验参数的测定指南

This International Standard gives the general guidelines for the determination of experimental parameters relating to the primary beam, the wavelength spectrometer and the sample that need to be taken into account when carrying out electron probe microanalysis. It also defines procedures for the determination of beam current, current density, dead time, wavelength resolution, background, analysis area, analysis depth and analysis volume. This International Standard is intended for the analysis of a well-polished sample using normal beam incidence, and the parameters obtained may only be indicative for other experimental conditions. This international standard is not designed to be used for energy dispersive X-ray spectroscopy.

Microbeam analysis - Electron microprobe analysis (Castaing Microprobe) - Guidelines for determining experimental parameters for wavelength dispersive spectrometry