Bruker Vutura 352双...

Bruker Vutura 352双焦面3D实时超高分辨系统参数指标

参数指标我要纠错

样本数:1

视野范围:40um*40um

扫描速度:最大300fps

扫描分辨率:横向20nm,轴向50nm

能量分辨率:不适用

应用领域:小动物


Vutara 352 Specifications

横向分辨率20 nm*
轴向分辨率50 nm*
采集速度Localization microscopy: up to 3,000 fps, Widefield: Up 30 fps
相机(包括2个)Localization microscopy: sCMOS (4.2 MP, 6.5 um x 6.5 um pixels 80% QE; Widefield sCMOS, 2.3 MP. 5.85 um x 5.86 um pixels, 80% QE
光学平台X,Y scanning stage with linear encoders, 120 mm x 72 mm range, 50 nm resolution
Piezo 聚焦Objective mount piezo, 400 um range, 0.7 nm resolution
视场Localization microscopy: 20 um x 20 um standard, 40 x 40 um optional; widefield 187 um x 187 um; confocal 87 um x 87 um
物镜Standard: Water, 60x 1.2 NA; optional: Silicone 60x, 13 NA; Oil 60 x 1.49 NA
标准层100 mW 405 nm; 1 W 488 nm , 561 nm and 640 nm

* Performance is sample and room dependent, typical resolutions can vary based upon preparation. Lateral resolution test specification with Tetraspek beads is , X,Y resolution should be less or equal to 20 nm and Z resolution less or equal to 50 nm. Colocalization tests with Tetraspek bead using three color is , X,Y colocalization between colors colors should be less or equal to 30 nm and Z colocalization between colors should be less or equal to 50


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