日本电子JED-2300/2300F 能谱仪电镜用能谱仪_ 参数_指标_优点_优势_分析测试百科网

参数指标

I:Standard model标准模式, II:Map model地图式模式, III:Montage model蒙太奇模式, IV:Particle analysis model颗粒分析模式, V:Large area particle analysis model大面积颗粒分析模式
●Built in, ○Optional

	機能	I	II	III	IV	V	Note
OS	OS Microsoft® Windows® XP or later version Multi user compatible
Operation menu	English
Detector	Select one from the list below	Multi user compatible
EDS spectral analysis	Qualitative analysis/Quantitative analysis (ZAF, Thin film)	●	●	●	●	●
	Visual Peak ID (VID)	●	●	●	●	●
	Thin film analysis	●	●	●	●	●
	Chemical type classification, Q base (Spectral matching)	●	●	●	●	●
	Count rate & Dead time real time display	●	●	●	●	●
Report generation	One click report	●	●	●	●	●
	SMile View™	●	●	●	●	●
	Exporting to Microsoft® Word、PowerPoint®	●	●	●	●	●
Integration	Automatic monitoring of microscope conditions (Magnification, accelerating voltage, and specimen stage position)	●	●	●	●	●	1
	SEM WD monitoring		●	●	●	●	2
	Analysis initiated on SEM GUI (Set analysis position on SEM monitor)		●	●	●	●	2
Analysis Assist	The analysis condition is set in the wizard form		●	●	●	●
Analysis Station	Analysis initiated on EDS monitor (Analysis position set on the SEM image on EDS monitor)		●	●	●	●
Line analysis	Line analysis, Quantitative line analysis Active map line		●	●	●	●
Elemental map	Elemental map (Active map, Map with 3 colors, Probe tracking)		●	●	●	●
	High-definition image (4096 3072pixels for SEM/TEM/Elemental map)		●	●	●	●
	Pop up spectrum		●	●	●	●
	Quantitative map		●	●	●	●
	Residual map		●	●	●	●
Elemental map on multiple areas	Graphic display of analysis positions, Navigation, Auto sequential analysis, Pin-point navi, Data archiving			●	●	●	3
Automatic sequential analysis on multiple areas	Auto montage (SEM image, elemental map)			●		●	3
Automatic sequential analysis on multiple areas	Automatic acquisition of elemental maps on multiple areas			●		●	3
Particle Analysis Software	Particle Analysis and EDS analysis (Auto/manual)				●	●
	Statistical analysis (Results, particle diameter, area, etc)				●	●
	Sequential particle & EDS analysis on multiple areas					●	4
	Particle Finder					●	4
	Manual review					●	4
GSR analysis	Automatic Gun shot residue analysis (Specimen for GSR)					●	4、5
PHI-RHO-Z quantitative analysis	Improved quantitative analysis of light elements	○	○	○	○	○
Probe current compensation	Monitoring of probe current, compensation for probe current fluctuation	○	○	○	○	○	6
Probe current compensation	Acquisition of user standard	○	○	○	○	○	6
Swing mouse	One set of mouse & keyboard control 2 PCs (SEM & EDS)	○	○	○	○	○	7
Phase analysis	Automatic phase analysis		○	○	○	○
Off line data analysis	Licence software for off line data analysis	○	○	○	○	○

Possible when EDS is linked to microscope PC.

Applicable to JCM-5700 & JSM-6X10A/LA

Applicable to SEM with motorized stage

Applicable to SEM with X, Y, Z motorized control

Optional GSR unit is required.

Optional Probe current compensation unit is required. Probe current monitoring is possible when EDS is linked to microscope PC. JSM-7001F/7500F/7600F do not require this unit.

JCM-5700 and JSM-6X10A/LA do not require. Items with T is specification of.8 JED-2300T.

Notices:Windows is a registered trademark of Microsoft Corporation in the United States and other countries.

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