仪器介绍:
名称:离子减薄仪
品牌:美国Gatan
型号:695
技术参数:
离子源
离子枪 两个潘宁离子枪与微型稀土永磁体
减薄角度 +10° 到 -10°,每个离子枪均独立可调节
离子束能量 100eV 到6.0 KeV
光束直径 5keV 下350μm FWHM - 宽离子枪5keV 下800μm FWHM
离子电流密度 最大 10mA/cm2
离子束调制 通过荧光屏精密调整离子束
离子束尺寸 通过气体控制调整
真空
干燥泵系统 两个部分,隔膜机械泵搭配一个70 升/秒涡轮分子泵
压力 5E-6 Torr(6.6E-4Pa)基本压力
8E-5 Torr(10.7E-3Pa)工作压力
真空计 样品室冷阴极标尺,搭配固态压力传感器
样品调换 Gatanzl WhisperlokTM,样品更换时间<1分钟
样品的Airlock <30 秒
功率
能量消耗 运行时需200W,离子枪关闭时需100W
电源要求 通用电压 100VAC-240VAC,50/60Hz(用户需确定电压和频率)
气体 氩气 25psi (1.42 bar,0.18 MPa)
优点
使用 X、Y 样品台来把减薄区域精确定位到离子束交叉点
改进低电压性能的离子枪,有用电压低至 100 伏,从而快速安全地对 FIB 制备的TEM样品进行抛光
利用 DigitalMicrograph® 软件和光学数码显微镜进行图像存储和分析
10 英寸彩色触摸屏可用于显示和控制所有 PIPS™ II 参数
Journal of Nuclear Materials
2015
Aitkaliyeva, A.; Madden, J. W.; Miller, B. D.; Cole, J. I.; Gan, J.
Surface and Coatings Technology
2021
Wu, Y.; Xiong, Y.; Liu, W.; Chen, Z.; Zhang, X.; Wang, S.; Cao, W.
International Journal of Metallurgy and Metal Physics
2021
Chen, W.; Ding, D.; Zhang, W.; Xiao, D.
Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction
Ultramicroscopy
2020
Addiego, C.; Gao, W.; Pan, X.
ECS Journal of Solid State Science and Technology
2019
Adikimenakis, A.; Chatzopoulou, P.; Dimitrakopulos, G. P.; Kehagias, Th.; Tsagaraki, K.; Androulidaki, M.; Doundoulakis, G.; Kuzmik, J.; Georgakilas, A.
American Mineralogist
2019
Wang, G.; Wang, H.; Wen, J.
Surface and Coatings Technology
2019
Kumar, A.; Nayak, S. K.; Bijalwan, P.; Dutta, M.; Banerjee, A.; Laha, T.
Basic Solid State Physics
2019
Olsen, V. S.; Bazioti, C.; Baldissera, G.; Azarov, A.; Prytz, Ø.; Persson, C.; Svensson, B. G.; Kuznetsov, A. Y.; Vines, L.
Continuous polycrystalline silicon layers on glass grown from tin solutions
CrystEngComm
2016
Bansen, R.; Ehlers, C.; Teubner, T.; Markurt, T.; Schmidtbauer, J.; Boeck, T.
Journal of Physics D: Applied Physics
2016
Wegele, T.; Beyer, A.; Ludewig, P.; Rosenow, P.; Duschek, L.; Jandieri, K.; Tonner, R.; Stolz, W.; Volz, K.
Assessment of residual stress fields at deformation twin tips and the surrounding environments
Acta Materialia
2016
Abdolvand, H.; Wilkinson, A. J.
Materials & Design
2016
Wang, L.; Mostaed, E.; Cao, X.; Huang, G.; Fabrizi, A.; Bonollo, F.; Chi, C.; Vedani, M.
Applied Microscopy
2015
Yoo, J. H.; Yang, J. -M.
Materials & Design
2015
Yang, J.; Huang, J.; Fan, D.; Chen, S.
Ultramicroscopy
2015
Tang, Y. L.; Zhu, Y. L.; Ma, X. L.
Evolution of annealing texture in cryo-rolled copper
Materials Science and Engineering: A
2015
Anand, G.; Barai, K.; Madhavan, R. Chattopadhyay, P. P.
Thermodynamic modelling of Al-UX (X= Si, Zr)
Journal of Nuclear Materials
2015
Rabin, D.; Shneck, R. Z.; Rafailov, G.; Dahan, I.; Meshi, L.; Brosh, E.
Local structure and thermoelectric properties of Mg 2 Si 0.977-x Ge x Bi 0.023
Journal of Alloys and Compounds
2015
Farahi, N.; Prabhudev, S.; Botton, G. A.; Zhao, J.; Tse, J. S.; Liu, Z.; Salvador, J. R.; Kleink, H.
Microstructural evolution of nanometric Ti(NiCu)2 precipitates in annealed Ni–Ti–Cu thin films
Vacuum
2015
Callisti, M.; Polcar, T.
The hardness and related deformation mechanisms in nanoscale crystalline–amorphous multilayers
Thin Solid Films
2015
Cui, Y.; Huang, P.; Wang, F.; Lu, T. J.; Xu, K. W.
Applied Physics Letters
2015
Gandman, M.; Kauffmann, Y.; Kaplan, W. D.
Journal of Materials Science
2014
Antou, G.; Guyot, P.; Pradeilles, N.; Vandenhende, M.; Maître, A.
Materials Characterization
2014
Bachmaier, A.; Aboulfadl, H.; Pfaff, M.; Mücklich, F.; Motz, C.
Journal of Alloys and Compounds
2014
Pawar, S.; Zhou, X.; Hashimoto, T.; Thompson, G. E.; Scamans, G.; Fan, Z.
APL Materials
2014
Zhou, D.; Sigle, W.; Okunishi, E.; Wang, Y.; Kelsch, M.; Habermeier, H. -U.; van Aken, P. A.
IEEE Transactions on Applied Superconductivity
2014
Galstyan, E.; Gharacheshmeh, H. M.; Delgado, L.; Xu, A.; Majkic, G.; Selvamanickam, V.
Automated CBED processing: Sample thickness estimation based on analysis of zone-axis CBED pattern
Ultramicroscopy
2014
Klinger, M.; Němec, M.; Polívka, L.; Gärtnerová, V.; Jäger, A.
Materials Science and Engineering: A
2014
Eftink, B. P.; Mara, N. A.; Kingstedt, O. T.; Safarik, D. J.; Lambros, J.; Robertson, I. M.
Foundations of Crystallography
2014
Li, X.; Ge, B.; Li, F.; Luo, H.; Wen, H.
Thin Solid Films
2014
Pfeiler-Deutschmann, M.; Mayrhofer, P. H.; Chladil, K.; Penoy, M.; Michotte, C.; Kathrein, M.; Mitterer, C.
Applied Physics Letters
2014
Pavlov, D. A.; Bobrov, A. I.; Novikov, A. V.; Sorokin, D. S.; Malekhonova, N. V.; Pirogov, A. V.; Nikolitchev, D. E.; Boryakov, A. V.
Journal of Crystal Growth
2014
Hospodková, A.; Pangrác, J.; Vyskočil, J.; Zíková, M.; Oswald, J.; Komninou, P.; Hulicius, E.
Physical properties of hot wall deposited Sn1-XPbXS thin films
Nanosystems: Physics, Chemistry Mathematics
2014
Gremenok, V. F.; Ivanov, V. A.; Izadneshan, H.; Lazenka, V. V.; Bakouie, A.
Materials Research Bulletin
2014
Wang, M. J.; Yang, H.; Zhang, Q. L.; Lin, Z. S.; Zhang, Z. S.; Yu, D.; Hu, L.
Evidence of dislocation cross-slip in MAX phase deformed at high temperature
Scientific Reports
2014
Guitton, A.; Joulain, A.; Thilly, L.; Tromas, C.
Formation of amorphous phase with crystalline globules in Fe–Cu–Nb–B immiscible alloys
Journal of Alloys and Compounds
2014
Nagase, T.; Suzuki, M.; Tanaka, T.
Ceramic-metallic (TiN-Cu) nanostructured ion-plasma vacuum-arc coatings for cutting hard-alloy tools
Russian Journal of Non-Ferrous Metals
2014
Blinkov, I. V.; Volkhonskii, A. O.; Laptev, A. I.; Sviridova, T. A.; Tabachkova, N. Yu.; Belov, D. S.; Ershova, A. V.
Advanced Energy Materials
2014
Benck, J. D.; Lee, S. C.; Fong, K. D.; Kibsgaard, J.; Sinclair, R.; Jaramillo, T. F.
Philosophical Magazine A
2013
Thorel, A.; Ciston, J.; Bartel, T.; Song. C. Y.; Dahmen, U.
Optimized Ar+-ion milling procedure for TEM cross-section sample preparation
Ultramicroscopy
2011
Dieterle, L.;Butz, B.; Müller, E.