61967-1-2002
Circuits Integres - Mesure Des Emissions Electro-Magnetiques@ 150 kHz a 1 GHz - Partie 1: Conditions Generales Et Definitions (Edition 1.0)

Integrated Circuits - Measurement of Electromagnetic Emissions@ 150 kHz to 1 GHz Part 1: General Conditions and Definitions (Edition 1.0)


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标准号
61967-1-2002
发布日期
2002年03月01日
实施日期
2018年12月15日
废止日期
中国标准分类号
/
国际标准分类号
/
发布单位
IEC - International Electrotechnical Commission
引用标准
56
适用范围
This part of IEC 61967 provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions@ test equipment and set-up as well as the test procedures and content of the test reports. A test method comparison table is included as annex A to assist in selecting the appropriate measurement method(s). The object of this standard is to describe general conditions in order to establish a uniform testing environment and obtain a quantitative measure of RF disturbances from integrated circuits (IC). Critical parameters that are expected to influence the test results are described. Deviations from this standard are noted explicitly in the individual test report. The measurement results can be used for comparison or other purposes. Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances@ coming from an integrated circuit under controlled conditions@ yields information about the potential for RF disturbances in an application of the integrated circuit.




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