EN 62435-2:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

EN 62435-2:2017 发布历史

IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

EN 62435-2:2017由欧洲电工标准化委员会 IX-CENELEC 发布于 2017-04-28，并于 2017-05-28 (7) 实施，于 2020-02-28 (7) 废止。

EN 62435-2:2017在国际标准分类中归属于: 31.020 电子元器件综合。

EN 62435-2:2017的历代版本如下：

• 2017年 EN 62435-2:2017

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标准号

EN 62435-2:2017

发布

2017年

发布单位

欧洲电工标准化委员会

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EN 62435-2:2017

 

 

适用范围

IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

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