62433-2-2017
EMC IC modelling – Part 2: Models of integrated circuits for EMI behavioural simulation – Conducted emissions modelling (ICEM-CE) (Edition 2.0)

Modèles de circuits intégrés pour la CEM – Partie 2: Modèles de circuits intégrés pour la simulation du comportement lors de perturbations électromagnétiques – Modélisation des émissions conduites (ICEM-CE) (Edition 2.0)

62433-2-2017 发布历史

This part of IEC 62433 specifies macro-models for an Integrated Circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model ?C Conducted Emission (ICEM-CE) The ICEM-CE macro-model can also be used for modelling an IC-die@ a functional block and an Intellectual Property (IP) block The ICEM-CE macro-model can be used to model both digital and analogue ICs Basically@ conducted emissions have two origins conducted emissions through power supply terminals and ground reference structures conducted emissions through input/output (I/O) terminals The ICEM-CE macro-model addresses those two types of origins in a single approach This standard defines structures and components of the macro-model for EMI simulation taking into account the IC??s internal activities This part of IEC 62433 has two main parts the first is the electrical description of ICEM-CE macro-model elements along with the specific requirements for information the second part proposes a universal data exchange format called CEML based on XML. This format allows encoding the ICEM-CE in a more useable and generic form for simulating the conducted emissions

62433-2-2017由IEC - International Electrotechnical Commission 发布于 2017-01-01，并于 2017-01-31 实施。

62433-2-2017 发布之时，引用了标准

• 222 *， 2018-07-31 更新

* 在 62433-2-2017 发布之后有更新，请注意新发布标准的变化。

62433-2-2017的历代版本如下：

• 2008年10月01日 62433-2-2008 Modèles de circuits intégrés pour la CEM – Partie 2: Modèles de circuits intégrés pour la simulation du comportement lors de perturbations électromagnétiques – Modélisation des émissions conduites (ICEM-CE) (Edition 1.0)
• 2017年01月01日 62433-2-2017 EMC IC modelling – Part 2: Models of integrated circuits for EMI behavioural simulation – Conducted emissions modelling (ICEM-CE) (Edition 2.0)

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标准号

62433-2-2017

发布日期

2017年01月01日

实施日期

2017年01月31日

废止日期

无

中国标准分类号

/

国际标准分类号

/

发布单位

IEC - International Electrotechnical Commission

引用标准

222

适用范围

This part of IEC 62433 specifies macro-models for an Integrated Circuit (IC) to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model ?C Conducted Emission (ICEM-CE) The ICEM-CE macro-model can also be used for modelling an IC-die@ a functional block and an Intellectual Property (IP) block The ICEM-CE macro-model can be used to model both digital and analogue ICs Basically@ conducted emissions have two origins conducted emissions through power supply terminals and ground reference structures conducted emissions through input/output (I/O) terminals The ICEM-CE macro-model addresses those two types of origins in a single approach This standard defines structures and components of the macro-model for EMI simulation taking into account the IC??s internal activities This part of IEC 62433 has two main parts the first is the electrical description of ICEM-CE macro-model elements along with the specific requirements for information the second part proposes a universal data exchange format called CEML based on XML. This format allows encoding the ICEM-CE in a more useable and generic form for simulating the conducted emissions