What is ISO 22278 about? ISO 22278 specifies the test method for measuring the crystalline quality of single-crystal thin film (wafer) using the XRD method with a parallel X-ray beam. ISO 22278 applies to all of the single-crystal thin film (wafer) as bulk or epitaxial layer structure. Who is ISO 22278 for? ISO 22278 on crystalline quality of the single-crystal thin film is useful for: Ceramic manufacturers Mechanical engineers
BS ISO 22278:2020由英国标准学会 GB-BSI 发布于 2020-08-31,并于 2020-08-31 实施。
BS ISO 22278:2020在国际标准分类中归属于: 81.060.30 高级陶瓷。
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