IEC 60444-2:1980
用π型网络零相位技术测量石英晶体元件参数 第2部分:测量石英晶体元件动态电容的相位偏置法
Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 2 : phase offset method for measurement of motional capacitance of quartz crystal units
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- 标准号
- IEC 60444-2:1980
- 发布
- 1980年
- 发布单位
- 国际电工委员会
- 当前最新
- IEC 60444-2:1980
- 适用范围
- Describes a method suitable for measurement in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5 %. This method is based on the phase measurement at the resonance frequency and in its vicinity. The value of the motiona