IEC 61967-1:2002
集成电路.150kHz-1GHz电磁辐射的测量.第1部分:一般条件和定义

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions

被代替

IEC 61967-1:2002 发布历史

IEC 61967-1:2002由国际电工委员会 IX-IEC 发布于 2002-03，并于 2018-12-15 实施。

IEC 61967-1:2002 在中国标准分类中归属于: L56 半导体集成电路，在国际标准分类中归属于: 01.040.31 电子学 (词汇),31.200 集成电路、微电子学。

IEC 61967-1:2002的历代版本如下：

• 2018年 IEC 61967-1:2018 集成电路电磁辐射测量第1部分:一般条件和定义
• 2010年 IEC 61967-1-1:2010 集成电路.电磁放射性的测量.第1-1部分:一般情况和定义.近场扫描数据交换格式
• 2002年 IEC 61967-1:2002 集成电路.150kHz-1GHz电磁辐射的测量.第1部分:一般条件和定义

This part of IEC 61967 provides general information and definitions on measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description of measurement conditions, test equipment and set-up as well as the test procedures and content of the test reports. A test method comparison table is included as annex A to assist in selecting the appropriate measurement method(s). The object of this standard is to describe general conditions in order to establish a uniform testing environment and obtain a quantitative measure of RF disturbances from integrated circuits (IC). Critical parameters that are expected to influence the test results are described. Deviations from this standard are noted explicitly in the individual test report. The measure-ment results can be used for comparison or other purposes. Measurement of the voltage and current of conducted RF emissions or radiated RF disturbances, coming from an integrated circuit under controlled conditions, yields information about the potential for RF disturbances in an application of the integrated circuit.

标准号

IEC 61967-1:2002

发布

2002年

发布单位

国际电工委员会

替代标准

IEC 61967-1-1:2010

当前最新

IEC 61967-1:2018

 

 

被代替标准

IEC 47A/632/FDIS:2001

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