JEDEC JEP179-2006
组装的固态表面贴装元件的测试驱使鉴定和故障机理分析已作废

Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface- Mount Components

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标准号

JEDEC JEP179-2006

发布日期

2006年06月01日

实施日期

废止日期

无

中国标准分类号

L97

发布单位

(美国)固态技术协会,隶属EIA

适用范围

The JEDEC standard DDR2 SDRAM must satisfy the requirement of 85C tCASE(max) operation at all times (Byte 47, bits 4:7 = 0000). There is an optional, higher tCASE operation allowed, up to 95C (Byte 47, bits 4:7 = 1010). If the optional higher tCASE limit is supported, there are two options that may or may not be supported to enhance the higher tCASE limit. These two options are vendor determined: (1) Double refresh required, (2) High Temp SR supported. If the base DRAM, i.e. tCASE(max) of 85C is specified, the two optional features are not required (but must be set to a default zero value.)

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