IEC/PAS 62396-2-2007
航空电子设备的过程管理.大气辐射影响.第2部分:航空电子系统单个事件影响测试用指南已作废

Process management for avionics - Atmospheric radiation effets - Part 2: Guidelines for single event effects testing for avionics systems

IEC/PAS 62396-2-2007 发布历史

the purpose of this PAS is to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects(SEE)induced by the atmospheric neutrons．Since the testing can be performed in a number of different ways using different kinds of radiation sources，it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere al aircraft altitudes． The type of SEE data avaliable can be viewed from many different perspectives．As indicated． the SEE testing can be performed using a variety of radiation sources，all of which can induce stagle event effects in ICs．In addition，many tests are performed on individual devices．but some tests expose an entire single board computer to radiation fields that can induce SEE effects However,a key discriminator is deciding on whether existing SEE data is available that may be used，or whether there really is no existing data and therefore．a SEE test on the device or board of interest has to be carried out

IEC/PAS 62396-2-2007由国际电工委员会 IX-IEC 发布于 2007-09，于 2008-08 废止。

IEC/PAS 62396-2-2007 在中国标准分类中归属于: V35 航空器及其附件综合，在国际标准分类中归属于: 03.100.50 生产、生产管理,31.020 电子元器件综合,49.060 航空航天用电气设备和系统。

IEC/PAS 62396-2-2007的历代版本如下：

• 2007年09月 IEC/PAS 62396-2-2007 航空电子设备的过程管理.大气辐射影响.第2部分:航空电子系统单个事件影响测试用指南

IEC/PAS 62396-2-2007 航空电子设备的过程管理.大气辐射影响.第2部分:航空电子系统单个事件影响测试用指南 于 2008-08-01 变更为 IEC/TS 62396-2-2008 电子设备的过程管理.大气辐射效应.第2部分:电子设备系统的单一作用效应测试指南。

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标准号

IEC/PAS 62396-2-2007

发布日期

2007年09月

实施日期

废止日期

2008-08

中国标准分类号

V35

国际标准分类号

03.100.50;31.020;49.060

发布单位

IX-IEC

代替标准

IEC/TS 62396-2-2008

适用范围

the purpose of this PAS is to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects(SEE)induced by the atmospheric neutrons．Since the testing can be performed in a number of different ways using different kinds of radiation sources，it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere al aircraft altitudes． The type of SEE data avaliable can be viewed from many different perspectives．As indicated． the SEE testing can be performed using a variety of radiation sources，all of which can induce stagle event effects in ICs．In addition，many tests are performed on individual devices．but some tests expose an entire single board computer to radiation fields that can induce SEE effects However,a key discriminator is deciding on whether existing SEE data is available that may be used，or whether there really is no existing data and therefore．a SEE test on the device or board of interest has to be carried out

IEC/PAS 62396-2-2007系列标准