the purpose of this PAS is to provide guidance related to the testing of microelectronic
devices for purposes of measuring their susceptibility to single event effects(SEE)induced by
the atmospheric neutrons．Since the testing can be performed in a number of different ways
using different kinds of radiation sources，it also shows how the test data can be used to
estimate the SEE rate of devices and boards due to the atmospheric neutrons in the
atmosphere al aircraft altitudes．
The type of SEE data avaliable can be viewed from many different perspectives．As indicated．
the SEE testing can be performed using a variety of radiation sources，all of which can induce
stagle event effects in ICs．In addition，many tests are performed on individual devices．but
some tests expose an entire single board computer to radiation fields that can induce SEE
effects However,a key discriminator is deciding on whether existing SEE data is available
that may be used，or whether there really is no existing data and therefore．a SEE test on the
device or board of interest has to be carried out