The purpose of this technical specification is to provide guidance related to the testing of
microelectronic devices for purposes of measuring their susceptibility to single event effects
(SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number
of different ways, using different kinds of radiation sources, it also shows how the test data
can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons
in the atmosphere at aircraft altitudes.