The purpose of this technical specification is to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.
IEC/TS 62396-2-2008由国际电工委员会 IX-IEC 发布于 2008-08-01。
IEC/TS 62396-2-2008 在中国标准分类中归属于: L04 基础标准与通用方法,V40 电气系统与设备,在国际标准分类中归属于: 49.060 航空航天用电气设备和系统。
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