IEC 62132-2-2010
集成电路.电磁抗扰度测量.第2部分:辐射抗干扰的测定.横电磁波传输室和宽带横电磁波传输室方法
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
- 标准号
- IEC 62132-2-2010
- 发布日期
- 2010年03月
- 实施日期
- 废止日期
- 无
- 中国标准分类号
- L56
- 国际标准分类号
- 31.200;33.100.20
- 发布单位
- IX-IEC
- 引用标准
- IEC 60050-131-2002 IEC 60050-161-1990 IEC 61967-2 IEC 62132-1-2006
- 被代替标准
- IEC 47A/838/FDIS-2010
- 适用范围
- This International Standard specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.