This International Standard specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.
IEC 62132-2-2010由国际电工委员会 IX-IEC 发布于 2010-03。
IEC 62132-2-2010 在中国标准分类中归属于: L56 半导体集成电路,在国际标准分类中归属于: 31.200 集成电路、微电子学,33.100.20 抗扰度。
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