This part of IEC 62258 has been developed to facilitate the production, supply and use of semiconductor die products, including - wafers, - singulated bare die, - die and wafers with attached connection structures, - minimally or partially encapsulated die and wafers. This standard defines the minimum requirements for the data which are needed to describe such die products and is intended as an aid in the design of and procurement of assemblies incorporating die products. It covers the requirements for data, including - product identity, - product data, - die mechanical information, - test, quality, assembly and reliability information, - handling, shipping and storage information. This standard covers the specific requirements for data needed to describe the geometrical properties of die, their physical properties and the means of connection necessary for their use in the development and manufacture of products. It also contains, in Annexes A and B, terminology and a list of common acronyms, respectively.
IEC 62258-1-2005由国际电工委员会 IX-IEC 发布于 2005-08。
IEC 62258-1-2005 在中国标准分类中归属于: L40 半导体分立器件综合,在国际标准分类中归属于: 31.080.01 半导体器分立件综合。
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