31.180 印制电路和印制电路板 标准查询与下载



共找到 1623 条与 印制电路和印制电路板 相关的标准,共 109

Printed electronics. Printability. Measurement of qualities. Classification and measurement methods for morphology

ICS
31.180
CCS
发布
2021-10-29
实施
2021-10-29

IEC 61189-2-807:2021 specifies a test method to determine the decomposition temperature (Td) of base laminate materials using thermogravimetric analysis (TGA).

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-807: Test methods for materials for interconnection structures - Decomposition temperature (Td) using TGA

ICS
31.180
CCS
发布
2021-10-15
实施
2022-01-08 (7)

本文件规定了挠性及刚挠印制电路板的分类、材料、性能要求、试验方法、检验规则、标识、包装、运输和贮存。 本文件适用于成品单面、双面、多层挠性及刚挠印制电路板。

Flexible and rigid-flexible printed circuit board

ICS
31.180
CCS
C398
发布
2021-10-08
实施
2021-10-12

Test methods for electrical materials, printed boards and other interconnection structures and assemblies -- Part 5-501: General test methods for materials and assemblies -- Surface insulation resistance (SIR) testing of solder fluxes (IEC 61189-5-501:202

ICS
31.180
CCS
发布
2021-10-07
实施
2021-10-07

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-504: General test methods for materials and assemblies - Process ionic contamination testing (PICT) (german version)

ICS
31.180
CCS
发布
2021-10-01
实施
2021-10-01

This part of IEC 62899 defines the terminology and measurement methods for the properties of stretchable printed layers, such as conductive ink, for forming stretchable conductors by printing, stretchable conductive films obtained from conductive ink, and stretchable printed wiri

Printed electronics - Part 202-4: Materials - Conductive ink - Measurement methods for properties of stretchable printed layers (conductive and insulating)

ICS
31.180
CCS
发布
2021-10-01
实施

This part of IEC 62878 specifies the generic requirements and test methods for device embedded substrates. The basic test methods for printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded

Device embedding assembly technology - Part 1: Generic specification for device embedded substrates (IEC 62878-1:2019); German version EN IEC 62878-1:2019

ICS
31.180
CCS
发布
2021-10-00
实施
2021-10-01

Printed electronics - Part 402-4: Printability - Measurement of qualities - Classification and measurement methods for morphology

ICS
31.180
CCS
发布
2021-09-21
实施

This part of IEC 61189 specifies a test method to determine the decomposition temperature (Td) of base laminate materials using thermogravimetric analysis (TGA).

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-807: Test methods for materials for interconnection structures - Decomposition temperature (Td) using TGA

ICS
31.180
CCS
发布
2021-09-01
实施

Device embedding assembly technology – Part 2-602: Guideline for stacked electronic module – Evaluation method of inter-module electrical connectivity

ICS
31.180
CCS
发布
2021-08-20
实施
2021-08-20

Device embedding assembly technology. Guideline for stacked electronic module. Evaluation method of inter-module electrical connectivity

ICS
31.180
CCS
发布
2021-08-20
实施
2021-08-20

Device embedding assembly technology. Guidelines. Warpage control of active device embedded substrate

ICS
31.180
CCS
发布
2021-07-29
实施
2021-07-29

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 5-301: General test methods for materials and assemblies - Soldering paste using fine solder particles (IEC 61189-5-301:2021)

ICS
31.180
CCS
发布
2021-07-15
实施
2021-07-15

IEC 61189-2-719:2016 specifies a test method of relative permittivity and loss tangent of printed board and assembly materials, expected to be determined 2 to 10 of relative permittivity and 0,001 to 0,050 of loss tangent at 500 MHz to 10 GHz.

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-719: Test methods for materials for interconnection structures - Relative permittivity and loss tangent (500 MHz to 10 GHz)

ICS
31.180
CCS
发布
2021-07-01
实施

IEC 61249-2-42:2010 gives requirements for properties of brominated epoxide non-woven reinforced core/woven E-glass reinforced surface laminate sheets of defined flammability (vertical burning test), copper-clad for lead-free assembly in thicknesses of 0,60 mm up to 1,70 mm. The flammability rating is achieved through the use of brominated fire retardants reacted as part of the epoxide polymeric structure. The glass transition temperature is defined to be 105 °C minimum.

Materials for printed boards and other interconnecting structures - Part 2-42: Reinforced base materials clad and unclad - Brominated epoxide non-woven/woven E-glass reinforced laminate sheets of defined flammability (vertical burning test), copper-cla...

ICS
31.180
CCS
发布
2021-07-01
实施

IEC 61191-6:2010 specifies the evaluation criteria for voids on the scale of the thermal cycle life, and the measurement method of voids using X-ray observation. This part of IEC 61191 is applicable to the voids generated in the solder joints of BGA and LGA soldered on a board. This part of IEC 61191 is not applicable to the BGA package itself before it is assembled on a board. This standard is applicable also to devices having joints made by melt and re-solidification, such as flip chip devices and multi-chip modules, in addition to BGA and LGA. This standard is not applicable to joints with under-fill between a device and a board, or to solder joints within a device package. This standard is applicable to macrovoids of the sizes of from 10 µm to several hundred micrometres generated in a soldered joint, but is not applicable to smaller voids (typically, planar microvoids) with a size of smaller than 10 µm in diameter. This standard is intended for evaluation purposes and is applicable to research studies, off-line production process control and reliability assessment of assembly.

Printed board assemblies - Part 6: Evaluation criteria for voids in soldered joints of BGA and LGA and measurement method

ICS
31.180
CCS
发布
2021-07-01
实施

IEC TS 61189-3-301:2016(E) outlines a way to determine the appearance non-uniformity of both the lustre and colour on plated metal surfaces in printed wiring boards (PWBs). The method is applicable to gold, nickel and copper plating in PWBs.

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 3-301: Test methods for interconnection structures (printed boards) - Appearance inspection method for plated surfaces on PWB

ICS
31.180
CCS
发布
2021-07-01
实施

IEC PAS 61182-2:2014(E) specifies the XML schema that represents the intelligent data file format used to describe printed board and printed board assembly products with details sufficient for tooling, manufacturing, assembly, and inspection requirements. This format may be used for transmitting information between a printed board designer and a manufacturing or assembly facility. The data is most useful when the manufacturing cycle includes computer-aided processes and numerical control machines.

Generic requirements for printed board assembly products manufacturing description data and transfer methodology

ICS
31.180
CCS
发布
2021-07-01
实施

IEC 61189-5-3:2015 is a catalogue of test methods representing methodologies and procedures that can be applied to test printed board assemblies. This part of IEC 61189 focuses on test methods for soldering paste based on the existing IEC 61189-5 and IEC 61189-6. In addition, it includes test methods of soldering paste for lead free soldering. This publication is to be read in conjunction with IEC 61189-1:1997, IEC 61189-2:2006 and IEC 61189-3:2007.

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 5-3: General test methods for materials and assemblies - Soldering paste for printed board assemblies

ICS
31.180
CCS
发布
2021-07-01
实施

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

ICS
31.180
CCS
发布
2021-07-01
实施



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