31.200 集成电路、微电子学 标准查询与下载
共找到 3192 条与 集成电路、微电子学 相关的标准，共 213 页
IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
- ICS
- 31.200
- CCS
- 发布
- 2012-11-30
- 实施
- 2012-11-30
Integrated circuits - measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC 47A/887/CD:2012)
- ICS
- 31.200
- CCS
- L55
- 发布
- 2012-11
- 实施
IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
- ICS
- 31.200
- CCS
- 发布
- 2012-09-21
- 实施
- 2012-11-10 (7)
IEC/TS 62132-9, Ed. 1: Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
- ICS
- 31.200
- CCS
- L06
- 发布
- 2012-06
- 实施
Integrated Circuits - Measurement of Electromagnetic Emissions - Part 3: Measurement of radiated emissions - Surface scan methodIntegrated circuits (IEC 47A/880/CD:2012)
- ICS
- 31.200
- CCS
- L56
- 发布
- 2012-05
- 实施
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (IEC 61967-8:2011); German version EN 61967-8:2011
- ICS
- 31.200
- CCS
- L56
- 发布
- 2012-04
- 实施
- 2012-04-01
Integrated circuits - Measurement of electromagnetic emissions -- Part 8: Measurement of radiated emissions - IC stripline method (IEC 61967-8:2011)
- ICS
- 31.200
- CCS
- 发布
- 2012-01-16
- 实施
- 2012-01-16
Integrated Circuits - Measurement of Electromagnetic Emissions - Part 3: Measurement of radiated emissions - Surface scan method
- ICS
- 31.200
- CCS
- L55
- 发布
- 2012-01
- 实施
Pb-Free Circuit Pack Testing Waive Conditions
- ICS
- 31.200
- CCS
- L55
- 发布
- 2012
- 实施
The measurement procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
- ICS
- 31.200
- CCS
- 发布
- 2011-12-09
- 实施
- 2011-12-09
Integrated circuits. Measurement of electromagnetic emissions. Measurement of radiated emissions. IC stripline method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2011-11-30
- 实施
- 2011-11-30
The measurement procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
- ICS
- 31.200
- CCS
- L56;A55
- 发布
- 2011-08
- 实施
- 2011-08-16
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010); German version EN 62132-2:2011
- ICS
- 31.200
- CCS
- L56
- 发布
- 2011-07
- 实施
- 2011-07-01
IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
- ICS
- 31.200
- CCS
- 发布
- 2011-05-29
- 实施
- 2011-05-29
Integrated circuits - Measurement of electromagnetic immunity -- Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010)
- ICS
- 31.200
- CCS
- 发布
- 2011-05-16
- 实施
- 2011-05-16
This International Standard specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.
Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. TEM cell and wideband TEM cell method
- ICS
- 31.200
- CCS
- L56
- 发布
- 2011-04-30
- 实施
- 2011-04-30
IEC 62132-2:2010 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.
Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
- ICS
- 31.200
- CCS
- 发布
- 2011-03-04
- 实施
- 2011-04-02 (7)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:200
- ICS
- 31.200
- CCS
- L56
- 发布
- 2011-02
- 实施
Defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing boundary scan (IEEE Std 1149.1) is not feasible. This standard describes the implementation rules for the test logic and test mode access/exit methods in compliant ICs. The standard is limited to the behavioral description of the implementation and will not include the technical design for the test logic or test mode control circuitry.
Standard for Static Component Interconnection Test Protocol and Architecture
- ICS
- 31.200
- CCS
- L79
- 发布
- 2011-01-01
- 实施
Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
- ICS
- 31.200
- CCS
- L04
- 发布
- 2011
- 实施
