L53 半导体发光器件 标准查询与下载

SJ 2355.7-1983 半导体发光器件测试方法.发光峰值波长和光谱半宽度的测试方法

Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices

SJ 2355.6-1983 半导体发光器件测试方法.光通量的测试方法

Method of measurement for luminous flux of light-emitting devices

SJ 2355.5-1983 半导体发光器件测试方法.法向光强和半强度角的测试方法

Method of measurement for luminous intensity and half-intensity angle of light-emitting devices

SJ 2658.12-1986 半导体红外发光二极管测试方法.峰值发射波长和光谱半宽度的测试方法

Methods of measurement for semiconductor infrared diodes Methods of measurement for peak emission wavelength and spectral half width

SJ 2658.11-1986 半导体红外发光二极管测试方法.脉冲响应特性的测试方法

Methods of measurement for semiconductor infrared diodes Methods of measurement for pulse response characteristics

SJ 2658.10-1986 半导体红外发光二极管测试方法.调制宽带的测试方法

Methods of measurement for semiconductor infrared diodes Methods of measurement for modulated wideband

SJ 2658.9-1986 半导体红外发光二极管测试方法.辐射强度空间分布和半强度角的测试方法

Methods of measurement for semiconductor infrared diodes Methods of measurement for the intensity space distribution and half-intensity angle of radiation

SJ 2658.8-1986 半导体红外发光二极管测试方法.法向辐射率的测试方法

Methods of measurement for semiconductor infrared diodes Methods of measurement for normal radiance

SJ 2658.7-1986 半导体红外发光二极管测试方法.辐射通量的测试方法

Methods of measurement for semiconductor infrared diodes Methods of measurement for radiant flux

SJ 2658.6-1986 半导体红外发光二极管测试方法.输出光功率的测试方法

Methods of measurement for semiconductor infrared diodes Methods of measurement for output optical power

SJ 2658.5-1986 半导体红外发光二极管测试方法.正向串联电阻的测试方法

Methods of measurement for semiconductor infrared diodes Methods of measurement for forward series resistance

SJ 2658.4-1986 半导体红外发光二极管测试方法.电容的测试方法

Methods of measurement for semiconductor infrared diodes Methods of measurement for capacitance

SJ 2658.3-1986 半导体红外发光二极管测试方法.反向电压测试方法

Methods of measurement for semiconductor infrared diodes Methods of measurement for backward voltage

SJ 20642.4-1998 半导体光电模块GH81型光耦合器详细规范

Semiconductor optoelectronic module Detail specification for type GH81 opto-couplers

SJ 20642.5-1998 半导体光电模块GH82型光耦合器详细规范

Semiconductor optoelectronic module Detail specification for type GH82 opto-couplers

SJ 2658.2-1986 半导体红外发光二极管测试方法.正向压降测试方法

Methods of measurement for semiconductor infrared diodes Methods of measurement for forward voltage drop

SJ/T 10948-1996 电子元器件详细规范 FG313052、FG314053、FG313054、FG314055型半导体红色发光二极管

Detailed specifications for electronic components - FG313052, FG314053, FG313054 and FG314055 semiconductor red light emitting diodes

SJ 2658.1-1986 半导体红外发光二极管测试方法.总则

Methods of measurement for semiconductor infrared diodes General rules

SJ/T 10947-1996 电子元器件详细规范 FG341052、FG343053型半导体绿色发光二极管

Detailed specifications for electronic components - FG341052 and FG343053 semiconductor green light emitting diodes

SJ 2658.13-1986 半导体红外发光二极管测试方法.输出光功率温度系数的测试方法

本标准适用于半导体红外发光二极管输出光功率温度系数的测试。

Methods of measurement for semiconductor infrared diodes Methods of measurement for output optical power temperature coefficient