L53 半导体发光器件 标准查询与下载

DIN EN 61683:2000 光伏系统.功率调节器.效率测量程序

The document applies for photovoltaic systems; power conditioners and procedure for measuring efficiency.

Photovoltaic systems - Power conditioners - Procedure for measuring efficiency (IEC 61683:1999); German version EN 61683:2000

DIN EN 61702:2000 直接耦合的光伏(PV)水泵系统的额定值

The document deals with rating of direct coupled photovoltaic (PV) pumping systems.

Rating of direct coupled photovoltaic (PV) pumping systems (IEC 61702:1995); German version EN 61702:1999

SJ 50033/143-1999 半导体光电子器件.GF1120型红色发光二极管详细规范

Semiconductor optoelectronic devices.Detail specification for type GF1120 red emitting diode

DIN EN 61747-2:1999 液晶和固体显示装置.第2部分:液晶显示模块.分规范

The document is a sectional specification for liquid crystal display modules.

Liquid crystal and solid-state display devices - Part 2: Liquid crystal display modules; sectional specification (IEC 61747-2:1998); German version EN 61747-2:1999

JEDEC J-STD-035-1999 非气密封装电子元件用声波显微镜

This test method defines the procedurfeosr performing acoustic microscopy on onhennetic encapsulated electronic components. This method provides users with an acoustic microscopy processf ofrlo w detecting anomalies (delamination, crackms,o ld compound voids, etc.) nondestructively in plastic packages while achieving reproducibility.

Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

IEC 62007-2:1999 纤维光学系统用半导体光电器件 第2部分:测量方法

This part of IEC 62007 describes the measuring methods applicable to the semiconductor optoelectronic devices to be used in the field of fibre optic systems and subsystems.

Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods

DIN EN 61747-5:1999 液晶和固态显示器.第5部分:环境、耐久和机械试验法

The document lists test methods applicable to liquid crystal display devices.

Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods (IEC 61747-5:1998); German version EN 61747-5:1998

IEC 62007-1:1999 光纤系统用半导体光电器件.第1部分:基本额定值及特性.

This part of IEC 62007 gives the essential ratings and characteristics of the following categories of semiconductor optoelectronic devices to be used in the field of fibre optic systems and subsystems: – semiconductor photoemitters; – semiconductor photoelectric detectors; – monolithic or hybrid integrated optoelectronic devices and their modules.

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Essential ratings and characteristics

GEIA SSB-1.004-1999 失败率测试 附件SSB-1 军事,航空航天和其他方面用塑料包裹微型电路和半导体指南

Failure-Mechanism-Driven Reliability Monitoring draws upon the concepts and implementation of line controls, process stability and effective monitoring programs in lieu of qualifying a product based solely on a fixed list of tests. A supplier must ident

Failure Rate Estimating Annex to SSB-1, Guidelines for Using of Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and Other Rugged Applications

GEIA SSB-1.001-1999 军事航空航天和其他方面申请用塑封微电路和半导体.资格和可靠性监视器.附件单边带- 1

The scope of this document is to establish the recommended minimum qualification and monitoring testing of plastic encapsulated microcircuits and discrete semiconductors suitable for potential use in many rugged, military, severe, or other environments.

Qualification and Reliability Monitors Annex to SSB-1, Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and Other Rugged Applications

GEIA SSB-1.002-1999 环境测试和相关失败机制 附件SSB-1,军事,航空航天和其他方面用塑料包裹微型电路和半导体指南

This document provides reference information concerning the environmental stresses associated with tests specifically designed to apply to (or have unique implications for) plastic encapsulated microcircuits and semiconductors, and the specific failures

Environmental Tests and Associated Failure Mechanisms Annex to SSB-1, Guidelines for Using Plastic Encapsulated Microcircuits and Semiconductors in Military, Aerospace and Other Rugged Applications

SJ 20723-1998 GG6001型脉冲信号光电隔离组件详细规范

本规范规定了GG6001型脉冲信号光电隔离组件的技术要求、质量保证规定、检验和试验方法、交货准备等要求。 本规范适用于组件的研制、生产和采购。

Detail specification for type GG6001 optoelectronic isolator assembly for pulse signal

SJ 20724-1998 GG2240型多路高速数据光电隔离组件详细规范

本规范规定了GG 2204型多路高速数据光电隔离组件的技术要求、质量保证规定、检验和试验方法、交货准备等要求。 本规范适用于组件的研制、生产和采购。

Detail specification for type GG2240 optoelectronic isolator assembly for multi-channel high-speed data

SJ/T 11152-1998 交流粉末电致发光显示器件空白详细规范(可供认证用)

本空白详细规范是SJ/T 10729-1996《交流粉末电致发光玻璃显示器件总规范》的补充性文件，它规定了详细规范所采用的格式和包括的内容。

Blank detail specification for a.c.powder electro luminescent display devices

JIS C 5940:1997 光纤传输用激光二极管总则

この規格は，光源として使用する光伝送用半導体レーザ(電子回路内蔵形を除く。以下,半導体レーザという。)の用語，分類，最大定格，性能などの一般的共通事項について規定する。

General rules of laser diodes for fiber optic transmission

JIS C 5951:1997 光纤传输用发光二极管测量方法

この規格は，光源として使用する光伝送用発光ダィオード(電子回路内蔵形を除く。以下,発光グイオードという。)の測定方法について規定する。

Measuring methods of light emitting diodes for fiber optic transmission

JIS C 5950:1997 光纤传输用发光二极管总则

この規格は，光源として使用する光伝送用発光ダィオード(電子回路内蔵形を除く。以下,発光ダイオードという。)の用語.記号.分類.最大定格，性能などの一般的共通事項について規定する。

General rules of light emitting diodes for fiber optic transmission

JIS C 5943:1997 录放用激光二极管测量方法

この規格は，光源として使用する再生及び記録用半導体レーザ(電子回路内蔵形を除く。以下,半導体レーザという。)の測定方法について規定する。

Measuring methods of laser diodes used for recording and playback

JIS C 5942:1997 录放用激光二极管总则

この規格は，光源として使用する再生及び記録用半導体レーザ〔電子回路内蔵形及び光学素子内蔵形を除く。以下,半導体レーザという。)の用語，記号.分類，最大定格，性能などの一般的共通事項について規定する。

General rules of laser diodes used for recording and playback

JIS C 5941:1997 光纤传输用激光二极管测量方法

この規格は，光源として使用する光伝送用半導体レーザ〔電子回路内蔵型を除く。ただし.必要に応じモニタ用フォトダィオードを含む。以下,半導体レーザという。)の測定方法について規定する。

Measuring methods of laser diodes for fiber optic transmission