GSO IEC 60748-11-1:2014

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

标准号

GSO IEC 60748-11-1:2014

发布

2014年

发布单位

GSO

当前最新

GSO IEC 60748-11-1:2014

 

 

The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specifica...

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