GSO IEC 60748-11-1:2014

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

GSO IEC 60748-11-1:2014 发布历史

GSO IEC 60748-11-1:2014由GSO 发布于 2014-12-25。

GSO IEC 60748-11-1:2014在国际标准分类中归属于: 31.200 集成电路、微电子学。

GSO IEC 60748-11-1:2014 的最新版本是哪一版？

最新版本是 GSO IEC 60748-11-1:2014 。

GSO IEC 60748-11-1:2014的历代版本如下：

• 2014年 GSO IEC 60748-11-1:2014

The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification. These tests will normally be used prior to capping or encapsulation on a 100 % inspection basis to detect and eliminate devices with internal defects that could lead to device failure in normal application. They may also be employed on a sampling basis prior to capping to determine the effectiveness of the manufacturer's quality control and handling procedures for semiconductor devices.

标准号

GSO IEC 60748-11-1:2014

发布

2014年

发布单位

GSO

当前最新

GSO IEC 60748-11-1:2014

 

 

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