JEDEC JEP134-1998
顾客提供的半导体仪器失败分析背景信息指南
Guidelines for Preparing Customer-Supplied Background Information Relating to a Semiconductor-Device Failure Analysis
JEDEC JEP134-1998 中，可能用到以下试剂
- 适用范围
- This Guideline addresses acquiring and transmitting pertinent background information that a failure analyst should have to complete an accurate and timely failure analysis of a semiconductor device. To this end, a suggested background-data form and explanations of its data items are included.