ASTM E1854-13
确保电子部件的中子引起的位移损伤试验一致性的标准实施规程

Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts


ASTM E1854-13 发布历史

ASTM E1854-13由美国材料与试验协会 US-ASTM 发布于 2013。

ASTM E1854-13 发布之时,引用了标准

  • ASTM E1018 ASTM评价横切面数据文件、矩阵E 706 (IIB)的标准指南
  • ASTM E1249 使用Co-60源的硅电子器件的辐射硬度测试中最小化剂量误差的标准实践
  • ASTM E1250 硅电子器件辐射强度试验用钴60辐射源的低能γ成分评估的电离箱的应用的标准试验方法
  • ASTM E1297 用铌辐射激活法测量快中子反应率的试验方法
  • ASTM E170 有关辐射测量和剂量测定的标准术语
  • ASTM E181 放射性核素探测器的校准和分析的标准试验方法
  • ASTM E1855 作为中子光谱传感器和位移破坏性监测器的2N2222A硅双极晶体管使用的标准试验方法
  • ASTM E2005 标准和参考中子场中反应堆剂量测定的基准试验的标准指南
  • ASTM E2450 混合中子光子环境中CaF<inf>2
  • ASTM E261 用放射性技术测定中子的积分通量率、积分通量和中子波谱
  • ASTM E262 用放射性技术测定热中子反应和积分通量率的试验方法
  • ASTM E263 用铁的放射性测量快中子反应速率的标准试验方法
  • ASTM E264 用镍的放射性测量快中子反应速率的标准试验方法
  • ASTM E265 用硫-32的放射性测量快速中子流量密度和反应速率的测试方法
  • ASTM E393 通过分析由裂变剂量计产生的钡140来测定反应速率的试验方法
  • ASTM E481 用钴和银的放射性测定中子积分通量率的试验方法
  • ASTM E482 E706(IID)反应堆容器监测中子传输方法应用的标准指南
  • ASTM E496 用放射性技术测量中子发生器中子注量率和平均能量的标准试验方法
  • ASTM E523 通过铜的放射性测量快中子反应速率的标准测试方法
  • ASTM E526 用钛的放射性测定快速中子反应率的试验方法
  • ASTM E666 计算γ或X射线吸收剂量的标准实施规程
  • ASTM E668 用于确定电子设备辐射硬度测试中吸收剂量的热释光剂量法(TLD)系统的标准实践
  • ASTM E704 用铀238的放射激活性测定反应速率的测试方法
  • ASTM E705 用镎237的放射激活性测定反应速率的测试方法
  • ASTM E720 电子辐射强度试验中中子波谱测定用中子激活箔的选择和应用标准指南
  • ASTM E721 电子辐射强度试验用中子激活箔测定中子能谱的标准指南
  • ASTM E722 确定电子辐射强度试验用等效单能级中子注量的能级中中子能量注量能谱的特征
  • ASTM E798 对基于加速器的中子源进行辐照的标准实施规程
  • ASTM E844 E-706(ⅡC)反应堆监视用传感器装置设计和辐照的标准指南
  • ASTM E944 反应堆监测时中子光谱调节法的应用
  • ASTM F1190 未加偏压的电子元件的中子照射标准指南
  • ASTM F980 硅半导体器件中子诱发位移损伤的快速退火测量指南

ASTM E1854-13的历代版本如下:

  • 2019年 ASTM E1854-19 确保电子零件中子诱发位移损伤试验一致性的标准实施规程
  • 2013年 ASTM E1854-13 确保电子部件的中子引起的位移损伤试验一致性的标准实施规程
  • 2007年 ASTM E1854-07 确保电子部件的中子引起的位移损伤试验一致性的标准实施规程
  • 2005年 ASTM E1854-05 确保电子部件的中子引起位移损害的试验一致性的标准实施规程
  • 2003年 ASTM E1854-03 确保电子部件的中子引起位移损害的试验一致性的标准实施规范
  • 1996年 ASTM E1854-96 电子部件的中子诱导取代损害的安全试验的标准操作规程

 

4.1 This practice was written primarily to guide test participants in establishing, identifying, maintaining, and using suitable environments for conducting high quality neutron tests. Its development was motivated, in large measure, because inadequate controls in the neutron-effects-test process have in some past instances resulted in exposures that have differed by factors of three or more from irradiation specifications. A radiation test environment generally differs from the environment in which the electronics must operate (the operational environment); therefore, a high quality test requires not only the use of a suitable radiation environment, but also control and compensation for contributions to damage that differ from those in the operational environment. In general, the responsibility for identifying suitable test environments to accomplish test objectives lies with the sponsor/user/tester and test specialist part of the team, with the assistance of an independent validator, if available. The responsibility for the establishment and maintenance of suitable environments lies with the facility operator/dosimetrist and test specialist, again with the possible assistance of an independent validator. Additional guidance on the selection of an irradiation facility is provided in Practice F1190.

4.2 This practice identifies the tasks that must be accomplished to ensure a successful high quality test. It is the overall responsibility of the sponsor or user to ensure that all of the required tasks are complete and conditions are met. Other participants provide appropriate documentation to enable the sponsor or user to make that determination.

4.3 The principal determinants of a properly conducted test are: (1) the radiation test environment shall be well characterized, controlled, and correlated with the specified irradiation levels; (2) damage produced in the electronic materials and devices is caused by the desired, specified component of the environment and can be reproduced at any other suitable facility; and (3) the damage corresponding to the specification level derived from radiation environments in which the electronics must operate can be predicted from the damage produced by the test environment. In order to ensure that these requirements are met, system developers, procurers, users, facility operators, and test personnel must collectively meet all of the essential requirements and effectively communicate to each other the tasks that must be accomplished and the conditions that must be met. Criteria for determining and maintaining the suitability of neutron radiation environments for 1-MeV equivalent displacement damage testing of electronics parts are presented in Section 5. Mandatory requirements for test consistency in neutron displacement damage testing of electronic parts are presented in Section 5. Additional background material on neutron testing and important considerations for gamma dose and dose rate effects are presented in (non-mandatory) Appendix X1 and Appendix X2, but compliance is not required.


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