31.190 电子元器件组件 标准查询与下载



共找到 380 条与 电子元器件组件 相关的标准,共 26

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-721: Test methods for materials for interconnection structures - Measurement of relative permittivity and loss tangent for copper clad lamin

ICS
31.190
CCS
L30
发布
2016-03
实施

Electronics assembly technology. Electronic modules

ICS
31.190
CCS
发布
2016
实施
2017-07-01

This part of IEC 62878@ which is a Technical Report@ describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material@ which include for example active or passive devices@ discrete components formed in the fabrication process of electronic wiring board@ and sheet formed components. The IEC 62878 series does not apply to the re-distribution layer (RDL) nor to the electronic modules defined as an M-type business model in IEC 62421.

Device embedded substrate - Part 2-2: Guidelines - Electrical testing

ICS
31.190
CCS
发布
2015-12-04
实施
2015-12-08

This part of IEC 61193 defines methods of registration and analysis of defects on soldered printed board assemblies. Methods are described to allow effective comparison of performance between products, processes and production locations and can serve as a basis for general quality improvement. The standard specifies defect data collection in two categories. Category 1 ppm data: this category provides data for registration purposes intended to enable overall performance comparison of assembly operations. Category 2 ppm data: this category provides data intended for individual subprocess assessment, analysis and control purposes.

Quality assessment systems - Part 1: Registration and analysis of defects on printed board assemblies

ICS
31.190
CCS
发布
2015-09-03
实施

The test method described in this part of IEC 62137 is applicable to gull-wing lead surface mounting components. The method is designed to test and evaluate the endurance of the solder joint between component leads and lands on a substrate, by means of a pull type mechanical stress. This test is suitable for evaluating the effects of repeated temperature change on the strength of the solder joint between component terminals and lands on a substrate.

Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-1: Pull strength test

ICS
31.190
CCS
发布
2015-09-03
实施

The test method described in this part of IEC 62137 applies to solder joints between terminals of surface mounting devices (SMDs) and land patterns on printed wiring boards (PWBs). This test is intended to evaluate the strength of the solder joints of larger sized multi-terminal components and other components in devices (e.g. handheld mobile devices) in the event that the device is dropped. The properties of the solder joints (e.g. solder alloy, substrate, mounted device or design, etc.) are evaluated to assist in improving the strength of the solder joints.

Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-3: Cyclic drop test

ICS
31.190
CCS
发布
2015-09-03
实施

The test method described in this part of IEC 62137 is applicable to leadless surface mounting components and surface mounting connectors to which pull test is not applicable. It is not applicable to multi-lead components and gull-wing leads. The method is designed to test and evaluate the endurance of the solder joint between component terminals and lands on a substrate, by means of a shear type mechanical stress. This test is applicable to evaluate the effects of repeated temperature change on the strength of the solder joints between terminals and lands on a substrate.

Surface mounting technology - Environmental and endurance test methods for surface mount solder joint - Part 1-2: Shear strength test

ICS
31.190
CCS
发布
2015-09-03
实施

This standard applies to labels on the packaging of electronic components for automatic handling. These labels use linear bar code and two-dimensional (2D) symbols. Labels for direct product marking and shipping labels are excluded. Labels required on the packaging of electronic components that are intended for the retail channel of distribution are also excluded from this standard. Bar code and 2D symbols markings are used, in general, for automatic identification and automatic handling of components in electronics assembly lines. Intended applications include systems that automate the control of component packages during production, inventory and internal distribution.

Product package labels for electronic components using bar code and two-dimensional symbologies

ICS
31.190
CCS
发布
2015-09-03
实施

Device embedded substrate - Guidelines - Data format

ICS
31.190
CCS
发布
2015-08-05
实施

Surface mounting technology. Classification, packaging, labelling and handling of moisture sensitive devices

ICS
31.190
CCS
L10
发布
2015-07-31
实施
2015-07-31

IEC 61760-4:2015 specifies the classification of moisture sensitive devices into moisture sensitivity levels related to soldering heat, and provisions for packaging, labelling and handling. It also extends the classification and packaging methods to such components, where currently existing standards are not required or not appropriate. For such cases this standard introduces additional moisture sensitivity levels and an alternative method for packaging. This standard applies to devices intended for reflow soldering, like surface mount devices, including specific through-hole devices (where the device supplier has specifically documented support for reflow soldering), but not to semiconductor devices and devices for flow (wave) soldering.

Surface mounting technology - Part 4: Classification, packaging, labelling and handling of moisture sensitive devices

ICS
31.190
CCS
发布
2015-07-03
实施
2015-09-23 (7)

Device embedded substrate - Part 1-1: Generic specification - Test methods

ICS
31.190
CCS
发布
2015-05-20
实施

This part of IEC 61760 specifies the classification of moisture sensitive devices into moisture sensitivity levels related to soldering heat@ and provisions for packaging@ labelling and handling. This part of IEC 61760 extends the classification and packaging methods to such components@ where currently existing standards are not required or not appropriate. For such cases this standard introduces additional moisture sensitivity levels and an alternative method for packaging. This standard applies to devices intended for reflow soldering@ like surface mount devices@ including specific through-hole devices (where the device supplier has specifically documented support for reflow soldering)@ but not to ? semiconductor devices@ ? devices for flow (wave) soldering. NOTE Background of this standard and its relation to currently existing standards@ e.g. IEC 60749-20 or J-STD- 020 and J-STD-033@ are described in the INTRODUCTION.

Surface mounting technology - Part 4: Classification, packaging, labelling and handling of moisture sensitive devices

ICS
31.190
CCS
发布
2015-05-19
实施
2018-03-15

Device embedded substrate - Part 2-4: Guidelines - Test element groups (TEG)

ICS
31.190
CCS
发布
2015-03-27
实施

Electronics assembly technology. Endurance test methods for solder joint of area array type package surface mount devices

ICS
31.190
CCS
发布
2015-02-28
实施
2015-02-28

Quality assessment systems. Part 1. Registration and analysis of defects on printed board assemblies

ICS
31.190
CCS
L30
发布
2015
实施
2016-08-01

Soldering of electronic modules of radio-electronic means. Automated mixed and surface mounting using lead-free and conventional technology. Technical requirements for the implementation of technological operations

ICS
31.190
CCS
L94
发布
2015
实施
2015-09-01

This part of IEC 61192 specifies general requirements for workmanship in soldered electronic assemblies on printed boards and on similar laminates attached to the surface(s) of organic substrates. This standard does not include hybrid circuits in which the conductor metallization is deposited directly on a ceramic substrate or onto a ceramic-coated metal substrate. It includes multichip modules assembled on organic substrates but excludes them when they are assembled on inorganic substrate surfaces such as ceramic or silicon. The purpose of this standards is: a) to define requirements and guidelines for good workmanship and practice in the preparation, soldering, inspection and testing of electronic and electrical assemblies; b) to enable achievement of high yields and high product quality through process control in production: c) to enable the suppliers and users of electronic assemblies to specify good manufacturing practice as part of a contract.

Workmanship requirements for soldered electronic assemblies - Part 1: General

ICS
31.190
CCS
发布
2014-12-25
实施

This part of IEC 61190 specifies general requirements for the characterization and testing of solder pastes used to make high-quality electronic interconnections in electronics assembly. This standard serves as a quality control document and is not intended to relate directly to the material's performance in the manufacturing process. Related information on flux characterization, quality control and procurement documentation for solder flux and flux containing material may be found in IEC 61190-1-1.

Attachment materials for electronic assembly - Part 1-2: Requirements for soldering pastes for high-quality interconnects in electronics assembly

ICS
31.190
CCS
发布
2014-12-25
实施

This part of IEC 61192 specifies general requirements for workmanship in terminal soldered assemblies on organic substrates, on printed boards, and on similar laminates attached to the surface(s) of inorganic substrates. It applies to assemblies that are totally terminals or mixed assemblies that include surfacemounting or other related assembly technologies, for example through-hole, wires.

Workmanship requirements for soldered electronic assemblies - Part 4: Terminal assemblies

ICS
31.190
CCS
发布
2014-12-25
实施



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